JPS5444873A - Controller for semiconductor measuring instrument - Google Patents

Controller for semiconductor measuring instrument

Info

Publication number
JPS5444873A
JPS5444873A JP11131077A JP11131077A JPS5444873A JP S5444873 A JPS5444873 A JP S5444873A JP 11131077 A JP11131077 A JP 11131077A JP 11131077 A JP11131077 A JP 11131077A JP S5444873 A JPS5444873 A JP S5444873A
Authority
JP
Japan
Prior art keywords
devices
circuit
discrimination
semiconductor
correspond
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11131077A
Other languages
Japanese (ja)
Inventor
Mamoru Oota
Yuji Seki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP11131077A priority Critical patent/JPS5444873A/en
Publication of JPS5444873A publication Critical patent/JPS5444873A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To make a discrimination with high efficiency by eliminating processes such as device separation, taking out and putting in, lead correction, etc., by discriminating characteristics of each semiconductor device while being formed with several devices on the same lead frame.
CONSTITUTION: A test signal is supplied from semiconductor measuring device 11 to semiconductor devices 131 to 134 to be tested via relay devices 121 to 124, and answer signals which correspond to it are returned to device 11 via relay devices 121 to 124 again. Those devices 121 to 124, which are driven and controlled by driver circuits 141 to 144 respectively, constitute multiplexer circuit 15. With a manual sequence switch signal from switch input circuit 17, respective relays 141 to 144 inside circuit 15 are driven and controlled by multiplexer control circuit 16, and these driving states are displayed by sequence display circuit 18. Further, discrimination signals which correspond to answer signals from devices 131 to 134 are supplied to discrimination display circuit 19, thereby displaying the quality of characteristics.
COPYRIGHT: (C)1979,JPO&Japio
JP11131077A 1977-09-16 1977-09-16 Controller for semiconductor measuring instrument Pending JPS5444873A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11131077A JPS5444873A (en) 1977-09-16 1977-09-16 Controller for semiconductor measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11131077A JPS5444873A (en) 1977-09-16 1977-09-16 Controller for semiconductor measuring instrument

Publications (1)

Publication Number Publication Date
JPS5444873A true JPS5444873A (en) 1979-04-09

Family

ID=14557978

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11131077A Pending JPS5444873A (en) 1977-09-16 1977-09-16 Controller for semiconductor measuring instrument

Country Status (1)

Country Link
JP (1) JPS5444873A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63150680A (en) * 1986-12-15 1988-06-23 Nec Corp Monitor dynamic burn-in testing device for ic
JPH01277949A (en) * 1988-04-28 1989-11-08 Fanuc Ltd Memory test system
JPH03214083A (en) * 1989-05-31 1991-09-19 American Teleph & Telegr Co <Att> Circuit board test system, testing method, test vector supply system and generating method
JPH0894702A (en) * 1994-09-28 1996-04-12 Nec Tohoku Ltd Withstand voltage testing device for electromagnetic relay

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63150680A (en) * 1986-12-15 1988-06-23 Nec Corp Monitor dynamic burn-in testing device for ic
JPH01277949A (en) * 1988-04-28 1989-11-08 Fanuc Ltd Memory test system
JPH03214083A (en) * 1989-05-31 1991-09-19 American Teleph & Telegr Co <Att> Circuit board test system, testing method, test vector supply system and generating method
JPH0894702A (en) * 1994-09-28 1996-04-12 Nec Tohoku Ltd Withstand voltage testing device for electromagnetic relay

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