JPS5444873A - Controller for semiconductor measuring instrument - Google Patents
Controller for semiconductor measuring instrumentInfo
- Publication number
- JPS5444873A JPS5444873A JP11131077A JP11131077A JPS5444873A JP S5444873 A JPS5444873 A JP S5444873A JP 11131077 A JP11131077 A JP 11131077A JP 11131077 A JP11131077 A JP 11131077A JP S5444873 A JPS5444873 A JP S5444873A
- Authority
- JP
- Japan
- Prior art keywords
- devices
- circuit
- discrimination
- semiconductor
- correspond
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To make a discrimination with high efficiency by eliminating processes such as device separation, taking out and putting in, lead correction, etc., by discriminating characteristics of each semiconductor device while being formed with several devices on the same lead frame.
CONSTITUTION: A test signal is supplied from semiconductor measuring device 11 to semiconductor devices 131 to 134 to be tested via relay devices 121 to 124, and answer signals which correspond to it are returned to device 11 via relay devices 121 to 124 again. Those devices 121 to 124, which are driven and controlled by driver circuits 141 to 144 respectively, constitute multiplexer circuit 15. With a manual sequence switch signal from switch input circuit 17, respective relays 141 to 144 inside circuit 15 are driven and controlled by multiplexer control circuit 16, and these driving states are displayed by sequence display circuit 18. Further, discrimination signals which correspond to answer signals from devices 131 to 134 are supplied to discrimination display circuit 19, thereby displaying the quality of characteristics.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11131077A JPS5444873A (en) | 1977-09-16 | 1977-09-16 | Controller for semiconductor measuring instrument |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11131077A JPS5444873A (en) | 1977-09-16 | 1977-09-16 | Controller for semiconductor measuring instrument |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5444873A true JPS5444873A (en) | 1979-04-09 |
Family
ID=14557978
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11131077A Pending JPS5444873A (en) | 1977-09-16 | 1977-09-16 | Controller for semiconductor measuring instrument |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5444873A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63150680A (en) * | 1986-12-15 | 1988-06-23 | Nec Corp | Monitor dynamic burn-in testing device for ic |
JPH01277949A (en) * | 1988-04-28 | 1989-11-08 | Fanuc Ltd | Memory test system |
JPH03214083A (en) * | 1989-05-31 | 1991-09-19 | American Teleph & Telegr Co <Att> | Circuit board test system, testing method, test vector supply system and generating method |
JPH0894702A (en) * | 1994-09-28 | 1996-04-12 | Nec Tohoku Ltd | Withstand voltage testing device for electromagnetic relay |
-
1977
- 1977-09-16 JP JP11131077A patent/JPS5444873A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63150680A (en) * | 1986-12-15 | 1988-06-23 | Nec Corp | Monitor dynamic burn-in testing device for ic |
JPH01277949A (en) * | 1988-04-28 | 1989-11-08 | Fanuc Ltd | Memory test system |
JPH03214083A (en) * | 1989-05-31 | 1991-09-19 | American Teleph & Telegr Co <Att> | Circuit board test system, testing method, test vector supply system and generating method |
JPH0894702A (en) * | 1994-09-28 | 1996-04-12 | Nec Tohoku Ltd | Withstand voltage testing device for electromagnetic relay |
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