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NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
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Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co LtdfiledCriticalNEC Corp
Priority to JP9530677ApriorityCriticalpatent/JPS5429578A/en
Publication of JPS5429578ApublicationCriticalpatent/JPS5429578A/en
Testing Of Individual Semiconductor Devices
(AREA)
Abstract
PURPOSE: To enable to perform measurement of the integration value for an arbitrary period of the measured current with comparatively simple constitution, by applying a voltage to measured object via a capacitor and by detecting the voltage charged up in this capacitor.
COPYRIGHT: (C)1979,JPO&Japio
JP9530677A1977-08-081977-08-08Current measuring cipcuit by constant voltage applicationn
PendingJPS5429578A
(en)