JPS5426915B2 - - Google Patents
Info
- Publication number
- JPS5426915B2 JPS5426915B2 JP10093176A JP10093176A JPS5426915B2 JP S5426915 B2 JPS5426915 B2 JP S5426915B2 JP 10093176 A JP10093176 A JP 10093176A JP 10093176 A JP10093176 A JP 10093176A JP S5426915 B2 JPS5426915 B2 JP S5426915B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10093176A JPS5326183A (en) | 1976-08-24 | 1976-08-24 | X-ray analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10093176A JPS5326183A (en) | 1976-08-24 | 1976-08-24 | X-ray analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5326183A JPS5326183A (en) | 1978-03-10 |
| JPS5426915B2 true JPS5426915B2 (no) | 1979-09-06 |
Family
ID=14287084
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10093176A Granted JPS5326183A (en) | 1976-08-24 | 1976-08-24 | X-ray analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5326183A (no) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS632988Y2 (no) * | 1980-07-21 | 1988-01-25 |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0448525Y2 (no) * | 1984-12-31 | 1992-11-16 | ||
| JPH0637318Y2 (ja) * | 1985-08-13 | 1994-09-28 | 株式会社島津製作所 | Ｘ線分光装置 |
| JPS62113051A (ja) * | 1985-11-13 | 1987-05-23 | Kawasaki Steel Corp | 薄膜層のｘ線回折測定方法及び装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5028274A (no) * | 1973-07-13 | 1975-03-22 |
-
1976
- 1976-08-24 JP JP10093176A patent/JPS5326183A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5028274A (no) * | 1973-07-13 | 1975-03-22 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS632988Y2 (no) * | 1980-07-21 | 1988-01-25 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5326183A (en) | 1978-03-10 |