JPS5425826B2 - - Google Patents
Info
- Publication number
- JPS5425826B2 JPS5425826B2 JP2899472A JP2899472A JPS5425826B2 JP S5425826 B2 JPS5425826 B2 JP S5425826B2 JP 2899472 A JP2899472 A JP 2899472A JP 2899472 A JP2899472 A JP 2899472A JP S5425826 B2 JPS5425826 B2 JP S5425826B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2899472A JPS5425826B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1972-03-24 | 1972-03-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2899472A JPS5425826B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1972-03-24 | 1972-03-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4896175A JPS4896175A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1973-12-08 |
| JPS5425826B2 true JPS5425826B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1979-08-30 |
Family
ID=12263952
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2899472A Expired JPS5425826B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1972-03-24 | 1972-03-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5425826B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3037983C2 (de) * | 1980-10-08 | 1983-03-31 | Fa. Carl Zeiss, 7920 Heidenheim | Verfahren und Vorrichtung zur lichtinduzierten rastermikroskopischen Darstellung von Probenparametern in ihrer räumlichen Verteilung |
| JPH053989U (ja) * | 1991-06-28 | 1993-01-22 | 日置電機株式会社 | 反射率測定装置 |
-
1972
- 1972-03-24 JP JP2899472A patent/JPS5425826B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS4896175A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1973-12-08 |