JPS5422470U - - Google Patents
Info
- Publication number
- JPS5422470U JPS5422470U JP9433577U JP9433577U JPS5422470U JP S5422470 U JPS5422470 U JP S5422470U JP 9433577 U JP9433577 U JP 9433577U JP 9433577 U JP9433577 U JP 9433577U JP S5422470 U JPS5422470 U JP S5422470U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9433577U JPS5422470U (enExample) | 1977-07-15 | 1977-07-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9433577U JPS5422470U (enExample) | 1977-07-15 | 1977-07-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5422470U true JPS5422470U (enExample) | 1979-02-14 |
Family
ID=29026236
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9433577U Pending JPS5422470U (enExample) | 1977-07-15 | 1977-07-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5422470U (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS619842U (ja) * | 1984-06-22 | 1986-01-21 | 日本電子株式会社 | 半導体試料装着装置 |
| JPS6259871A (ja) * | 1985-09-10 | 1987-03-16 | Matsushita Electric Ind Co Ltd | 回路基板の検査方法 |
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1977
- 1977-07-15 JP JP9433577U patent/JPS5422470U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS619842U (ja) * | 1984-06-22 | 1986-01-21 | 日本電子株式会社 | 半導体試料装着装置 |
| JPS6259871A (ja) * | 1985-09-10 | 1987-03-16 | Matsushita Electric Ind Co Ltd | 回路基板の検査方法 |