JPS5422470U - - Google Patents

Info

Publication number
JPS5422470U
JPS5422470U JP9433577U JP9433577U JPS5422470U JP S5422470 U JPS5422470 U JP S5422470U JP 9433577 U JP9433577 U JP 9433577U JP 9433577 U JP9433577 U JP 9433577U JP S5422470 U JPS5422470 U JP S5422470U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9433577U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9433577U priority Critical patent/JPS5422470U/ja
Publication of JPS5422470U publication Critical patent/JPS5422470U/ja
Pending legal-status Critical Current

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP9433577U 1977-07-15 1977-07-15 Pending JPS5422470U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9433577U JPS5422470U (enrdf_load_stackoverflow) 1977-07-15 1977-07-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9433577U JPS5422470U (enrdf_load_stackoverflow) 1977-07-15 1977-07-15

Publications (1)

Publication Number Publication Date
JPS5422470U true JPS5422470U (enrdf_load_stackoverflow) 1979-02-14

Family

ID=29026236

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9433577U Pending JPS5422470U (enrdf_load_stackoverflow) 1977-07-15 1977-07-15

Country Status (1)

Country Link
JP (1) JPS5422470U (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS619842U (ja) * 1984-06-22 1986-01-21 日本電子株式会社 半導体試料装着装置
JPS6259871A (ja) * 1985-09-10 1987-03-16 Matsushita Electric Ind Co Ltd 回路基板の検査方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS619842U (ja) * 1984-06-22 1986-01-21 日本電子株式会社 半導体試料装着装置
JPS6259871A (ja) * 1985-09-10 1987-03-16 Matsushita Electric Ind Co Ltd 回路基板の検査方法

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