JPS5420789A - Multipoint air sampling apparatus - Google Patents

Multipoint air sampling apparatus

Info

Publication number
JPS5420789A
JPS5420789A JP8425977A JP8425977A JPS5420789A JP S5420789 A JPS5420789 A JP S5420789A JP 8425977 A JP8425977 A JP 8425977A JP 8425977 A JP8425977 A JP 8425977A JP S5420789 A JPS5420789 A JP S5420789A
Authority
JP
Japan
Prior art keywords
sampling apparatus
air sampling
multipoint air
dust
multipoint
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8425977A
Other languages
Japanese (ja)
Inventor
Kinya Sugimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8425977A priority Critical patent/JPS5420789A/en
Publication of JPS5420789A publication Critical patent/JPS5420789A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To enable highly accurate measurement and supervision of dust number by providing flow controllers to the exhaust side of a dust counter and operating flow control valves for respective samplers through changing over of a sampling point change-over device.
COPYRIGHT: (C)1979,JPO&Japio
JP8425977A 1977-07-15 1977-07-15 Multipoint air sampling apparatus Pending JPS5420789A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8425977A JPS5420789A (en) 1977-07-15 1977-07-15 Multipoint air sampling apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8425977A JPS5420789A (en) 1977-07-15 1977-07-15 Multipoint air sampling apparatus

Publications (1)

Publication Number Publication Date
JPS5420789A true JPS5420789A (en) 1979-02-16

Family

ID=13825446

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8425977A Pending JPS5420789A (en) 1977-07-15 1977-07-15 Multipoint air sampling apparatus

Country Status (1)

Country Link
JP (1) JPS5420789A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5954167A (en) * 1982-08-30 1984-03-28 パテント−トロイハント−ゲゼルシヤフト・フユ−ル・エレクトリツシエ・グリユ−ラムペン・ミツト・ベシユレンクテル・ハフツング High voltage discharge lamp of low output
JPH03172732A (en) * 1989-12-01 1991-07-26 Toyo Netsu Kogyo Kk Multi-spot measuring instrument and multi-spot measuring method using same
US6470760B2 (en) * 1998-06-29 2002-10-29 Nec Corporation Method and apparatus for automatically analyzing trace substance
JP2006275983A (en) * 2005-03-30 2006-10-12 Nippon Muki Co Ltd Apparatus for testing filter
JP2021181993A (en) * 2014-08-28 2021-11-25 ベルテック アソシエイツ インコーポレイテッドVeltek Associates, Inc. Programmable logic controller-based system and user interface for air sampling in controlled environments
CN114001992A (en) * 2021-11-01 2022-02-01 上海励江机电设备安装有限公司 Dust removal detection device of electrostatic dust collector
US11808674B2 (en) 2008-02-07 2023-11-07 Veltek Associates, Inc. System and method for air sampling in controlled environments
CN114001992B (en) * 2021-11-01 2024-04-19 上海励江机电设备安装有限公司 Dust removal detection device of electrostatic precipitator

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5954167A (en) * 1982-08-30 1984-03-28 パテント−トロイハント−ゲゼルシヤフト・フユ−ル・エレクトリツシエ・グリユ−ラムペン・ミツト・ベシユレンクテル・ハフツング High voltage discharge lamp of low output
JPH0531264B2 (en) * 1982-08-30 1993-05-12 Patento Toroihanto G Fuyuuru Erekutoritsushe Guryuuranpen Mbh
JPH03172732A (en) * 1989-12-01 1991-07-26 Toyo Netsu Kogyo Kk Multi-spot measuring instrument and multi-spot measuring method using same
US6470760B2 (en) * 1998-06-29 2002-10-29 Nec Corporation Method and apparatus for automatically analyzing trace substance
JP2006275983A (en) * 2005-03-30 2006-10-12 Nippon Muki Co Ltd Apparatus for testing filter
JP4579744B2 (en) * 2005-03-30 2010-11-10 日本無機株式会社 Filter inspection device
US11808674B2 (en) 2008-02-07 2023-11-07 Veltek Associates, Inc. System and method for air sampling in controlled environments
JP2021181993A (en) * 2014-08-28 2021-11-25 ベルテック アソシエイツ インコーポレイテッドVeltek Associates, Inc. Programmable logic controller-based system and user interface for air sampling in controlled environments
JP2022071116A (en) * 2014-08-28 2022-05-13 ベルテック アソシエイツ インコーポレイテッド System and user interface based on programmable logic controller for sampling air in controlled environment
CN114001992A (en) * 2021-11-01 2022-02-01 上海励江机电设备安装有限公司 Dust removal detection device of electrostatic dust collector
CN114001992B (en) * 2021-11-01 2024-04-19 上海励江机电设备安装有限公司 Dust removal detection device of electrostatic precipitator

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