JPS542074A - Alignment unit - Google Patents
Alignment unitInfo
- Publication number
- JPS542074A JPS542074A JP6689877A JP6689877A JPS542074A JP S542074 A JPS542074 A JP S542074A JP 6689877 A JP6689877 A JP 6689877A JP 6689877 A JP6689877 A JP 6689877A JP S542074 A JPS542074 A JP S542074A
- Authority
- JP
- Japan
- Prior art keywords
- alignment unit
- scanning lines
- scanning
- alignment
- signl
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6689877A JPS542074A (en) | 1977-06-07 | 1977-06-07 | Alignment unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6689877A JPS542074A (en) | 1977-06-07 | 1977-06-07 | Alignment unit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS542074A true JPS542074A (en) | 1979-01-09 |
| JPS6114654B2 JPS6114654B2 (enExample) | 1986-04-19 |
Family
ID=13329200
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6689877A Granted JPS542074A (en) | 1977-06-07 | 1977-06-07 | Alignment unit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS542074A (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5225575A (en) * | 1975-08-22 | 1977-02-25 | Hitachi Ltd | Inspection method of the state of object |
-
1977
- 1977-06-07 JP JP6689877A patent/JPS542074A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5225575A (en) * | 1975-08-22 | 1977-02-25 | Hitachi Ltd | Inspection method of the state of object |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6114654B2 (enExample) | 1986-04-19 |
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