JPS54173673U - - Google Patents

Info

Publication number
JPS54173673U
JPS54173673U JP7167878U JP7167878U JPS54173673U JP S54173673 U JPS54173673 U JP S54173673U JP 7167878 U JP7167878 U JP 7167878U JP 7167878 U JP7167878 U JP 7167878U JP S54173673 U JPS54173673 U JP S54173673U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7167878U
Other languages
Japanese (ja)
Other versions
JPS5822144Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1978071678U priority Critical patent/JPS5822144Y2/ja
Publication of JPS54173673U publication Critical patent/JPS54173673U/ja
Application granted granted Critical
Publication of JPS5822144Y2 publication Critical patent/JPS5822144Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP1978071678U 1978-05-29 1978-05-29 プロ−ブカ−ド Expired JPS5822144Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1978071678U JPS5822144Y2 (ja) 1978-05-29 1978-05-29 プロ−ブカ−ド

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1978071678U JPS5822144Y2 (ja) 1978-05-29 1978-05-29 プロ−ブカ−ド

Publications (2)

Publication Number Publication Date
JPS54173673U true JPS54173673U (cg-RX-API-DMAC7.html) 1979-12-07
JPS5822144Y2 JPS5822144Y2 (ja) 1983-05-11

Family

ID=28982667

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1978071678U Expired JPS5822144Y2 (ja) 1978-05-29 1978-05-29 プロ−ブカ−ド

Country Status (1)

Country Link
JP (1) JPS5822144Y2 (cg-RX-API-DMAC7.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59138345A (ja) * 1983-01-27 1984-08-08 Rohm Co Ltd プロ−ブカ−ド
JP2004233155A (ja) * 2003-01-29 2004-08-19 Fujitsu Ltd プローブカードおよび半導体チップの検査方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53102379U (cg-RX-API-DMAC7.html) * 1977-01-20 1978-08-18

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53102379U (cg-RX-API-DMAC7.html) * 1977-01-20 1978-08-18

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59138345A (ja) * 1983-01-27 1984-08-08 Rohm Co Ltd プロ−ブカ−ド
JP2004233155A (ja) * 2003-01-29 2004-08-19 Fujitsu Ltd プローブカードおよび半導体チップの検査方法

Also Published As

Publication number Publication date
JPS5822144Y2 (ja) 1983-05-11

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