JPS54171390U - - Google Patents
Info
- Publication number
- JPS54171390U JPS54171390U JP6944878U JP6944878U JPS54171390U JP S54171390 U JPS54171390 U JP S54171390U JP 6944878 U JP6944878 U JP 6944878U JP 6944878 U JP6944878 U JP 6944878U JP S54171390 U JPS54171390 U JP S54171390U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6944878U JPS54171390U (en) | 1978-05-23 | 1978-05-23 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6944878U JPS54171390U (en) | 1978-05-23 | 1978-05-23 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54171390U true JPS54171390U (en) | 1979-12-04 |
Family
ID=28978281
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6944878U Pending JPS54171390U (en) | 1978-05-23 | 1978-05-23 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54171390U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58219441A (en) * | 1982-06-15 | 1983-12-20 | Hajime Sangyo Kk | Apparatus for detecting defect on surface of convex object |
JP2017072382A (en) * | 2015-10-05 | 2017-04-13 | 富士通株式会社 | Inspection reference light generator, inspection reference light generation method, inspection apparatus, inspection method |
-
1978
- 1978-05-23 JP JP6944878U patent/JPS54171390U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58219441A (en) * | 1982-06-15 | 1983-12-20 | Hajime Sangyo Kk | Apparatus for detecting defect on surface of convex object |
JP2017072382A (en) * | 2015-10-05 | 2017-04-13 | 富士通株式会社 | Inspection reference light generator, inspection reference light generation method, inspection apparatus, inspection method |