JPS5417079A - Automatic surface inspecting system for round body - Google Patents

Automatic surface inspecting system for round body

Info

Publication number
JPS5417079A
JPS5417079A JP8172677A JP8172677A JPS5417079A JP S5417079 A JPS5417079 A JP S5417079A JP 8172677 A JP8172677 A JP 8172677A JP 8172677 A JP8172677 A JP 8172677A JP S5417079 A JPS5417079 A JP S5417079A
Authority
JP
Japan
Prior art keywords
round body
automatic surface
inspecting system
surface inspecting
bit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8172677A
Other languages
Japanese (ja)
Inventor
Hiromichi Fukuchi
Terubumi Honjo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP8172677A priority Critical patent/JPS5417079A/en
Publication of JPS5417079A publication Critical patent/JPS5417079A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To inspect a flaw or the like to a satisfactory extent with the use of a simple construction by storing the newest image information bit in a shift resistor so as to comparet he stored information of a preset bit according to the radial area with the preset value according to the radius.
JP8172677A 1977-07-07 1977-07-07 Automatic surface inspecting system for round body Pending JPS5417079A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8172677A JPS5417079A (en) 1977-07-07 1977-07-07 Automatic surface inspecting system for round body

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8172677A JPS5417079A (en) 1977-07-07 1977-07-07 Automatic surface inspecting system for round body

Publications (1)

Publication Number Publication Date
JPS5417079A true JPS5417079A (en) 1979-02-08

Family

ID=13754408

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8172677A Pending JPS5417079A (en) 1977-07-07 1977-07-07 Automatic surface inspecting system for round body

Country Status (1)

Country Link
JP (1) JPS5417079A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62274245A (en) * 1986-05-23 1987-11-28 Aisin Takaoka Ltd Surface inspection device for discoid component

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62274245A (en) * 1986-05-23 1987-11-28 Aisin Takaoka Ltd Surface inspection device for discoid component

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