JPS5416439B2 - - Google Patents
Info
- Publication number
- JPS5416439B2 JPS5416439B2 JP1240274A JP1240274A JPS5416439B2 JP S5416439 B2 JPS5416439 B2 JP S5416439B2 JP 1240274 A JP1240274 A JP 1240274A JP 1240274 A JP1240274 A JP 1240274A JP S5416439 B2 JPS5416439 B2 JP S5416439B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1240274A JPS5416439B2 (ja) | 1974-01-30 | 1974-01-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1240274A JPS5416439B2 (ja) | 1974-01-30 | 1974-01-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS49109090A JPS49109090A (ja) | 1974-10-17 |
JPS5416439B2 true JPS5416439B2 (ja) | 1979-06-22 |
Family
ID=11804256
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1240274A Expired JPS5416439B2 (ja) | 1974-01-30 | 1974-01-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5416439B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2585616B2 (ja) * | 1987-08-12 | 1997-02-26 | 株式会社日立製作所 | 二次イオン質量分析計方法 |
-
1974
- 1974-01-30 JP JP1240274A patent/JPS5416439B2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS49109090A (ja) | 1974-10-17 |