JPS541630B2 - - Google Patents
Info
- Publication number
- JPS541630B2 JPS541630B2 JP675374A JP675374A JPS541630B2 JP S541630 B2 JPS541630 B2 JP S541630B2 JP 675374 A JP675374 A JP 675374A JP 675374 A JP675374 A JP 675374A JP S541630 B2 JPS541630 B2 JP S541630B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP675374A JPS541630B2 (en:Method) | 1974-01-12 | 1974-01-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP675374A JPS541630B2 (en:Method) | 1974-01-12 | 1974-01-12 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50135987A JPS50135987A (en:Method) | 1975-10-28 |
| JPS541630B2 true JPS541630B2 (en:Method) | 1979-01-26 |
Family
ID=11646935
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP675374A Expired JPS541630B2 (en:Method) | 1974-01-12 | 1974-01-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS541630B2 (en:Method) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60153136A (ja) * | 1984-01-21 | 1985-08-12 | Semiconductor Res Found | 光照射用電極プロ−ブ |
| JPH0717023Y2 (ja) * | 1987-08-04 | 1995-04-19 | グラフテック株式会社 | フアンクシヨンテスタ |
-
1974
- 1974-01-12 JP JP675374A patent/JPS541630B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS50135987A (en:Method) | 1975-10-28 |