JPS54160193A - Ct scanner - Google Patents
Ct scannerInfo
- Publication number
- JPS54160193A JPS54160193A JP6896678A JP6896678A JPS54160193A JP S54160193 A JPS54160193 A JP S54160193A JP 6896678 A JP6896678 A JP 6896678A JP 6896678 A JP6896678 A JP 6896678A JP S54160193 A JPS54160193 A JP S54160193A
- Authority
- JP
- Japan
- Prior art keywords
- collimator
- center part
- fringe
- center
- slit width
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003247 decreasing effect Effects 0.000 abstract 2
- 230000005855 radiation Effects 0.000 abstract 2
- 230000000694 effects Effects 0.000 abstract 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6896678A JPS54160193A (en) | 1978-06-09 | 1978-06-09 | Ct scanner |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6896678A JPS54160193A (en) | 1978-06-09 | 1978-06-09 | Ct scanner |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS54160193A true JPS54160193A (en) | 1979-12-18 |
| JPS6233897B2 JPS6233897B2 (enExample) | 1987-07-23 |
Family
ID=13388915
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6896678A Granted JPS54160193A (en) | 1978-06-09 | 1978-06-09 | Ct scanner |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54160193A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006351303A (ja) * | 2005-06-15 | 2006-12-28 | Hitachi High-Technologies Corp | パターン欠陥検査方法および装置 |
| JP2011159636A (ja) * | 2011-05-11 | 2011-08-18 | Hitachi High-Technologies Corp | パターン欠陥検査方法および装置 |
-
1978
- 1978-06-09 JP JP6896678A patent/JPS54160193A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006351303A (ja) * | 2005-06-15 | 2006-12-28 | Hitachi High-Technologies Corp | パターン欠陥検査方法および装置 |
| JP2011159636A (ja) * | 2011-05-11 | 2011-08-18 | Hitachi High-Technologies Corp | パターン欠陥検査方法および装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6233897B2 (enExample) | 1987-07-23 |
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