JPS54151876A - Magnetic field impressing device - Google Patents
Magnetic field impressing deviceInfo
- Publication number
- JPS54151876A JPS54151876A JP6085478A JP6085478A JPS54151876A JP S54151876 A JPS54151876 A JP S54151876A JP 6085478 A JP6085478 A JP 6085478A JP 6085478 A JP6085478 A JP 6085478A JP S54151876 A JPS54151876 A JP S54151876A
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- slit
- magnetic
- test piece
- pole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Magnetic Variables (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Abstract
PURPOSE: To make it possible to measure a magnetic member having a high magnetic reserving power without cutting a test piece by arranging two pairs of magnets in a manner to face one another so that a magnetic field may be established in their intermediate region and by forming a portion of an iron core with a slit.
CONSTITUTION: The core 1 of an electromagnet is formed at its portion with a slit 6, and such electromagnets are paired and arranged such that the same polarities face each other. An energizing coil 5 is arranged in a vertically symmetrical position. A laser beam or an incandescent light 12 is made to illuminate a test piece 12 through the slit 6 so that the mehaviour of the test piece 4 is measured from a relatively weaker magnetic field to a strong magnetic field with the use of the color or Farady effects. The magnetic flux from the N pole toward the S pole is horizontally uniform at the facing intermediate regions. Thus, the magneticity of a magnetic disk or the like can be beasured continuously without any breakage.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6085478A JPS54151876A (en) | 1978-05-22 | 1978-05-22 | Magnetic field impressing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6085478A JPS54151876A (en) | 1978-05-22 | 1978-05-22 | Magnetic field impressing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54151876A true JPS54151876A (en) | 1979-11-29 |
Family
ID=13154376
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6085478A Pending JPS54151876A (en) | 1978-05-22 | 1978-05-22 | Magnetic field impressing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54151876A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63302384A (en) * | 1987-06-03 | 1988-12-09 | Hitachi Ltd | Magnetic defect inspecting apparatus |
JPH01155283A (en) * | 1987-12-14 | 1989-06-19 | Hitachi Ltd | Evaluating apparatus of magnetic disk |
JPH0390881A (en) * | 1989-08-25 | 1991-04-16 | Ldj Electron Inc | Apparatus for measuring hysteresis loop of magnetic film |
JPH0494586U (en) * | 1990-12-27 | 1992-08-17 | ||
JPH06109655A (en) * | 1992-09-28 | 1994-04-22 | Nippon Steel Corp | Magneto-optic defect inspecting apparatus |
JPH0665883U (en) * | 1991-06-19 | 1994-09-16 | 有限会社アスカ電子 | Micro domain structure observation device |
-
1978
- 1978-05-22 JP JP6085478A patent/JPS54151876A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63302384A (en) * | 1987-06-03 | 1988-12-09 | Hitachi Ltd | Magnetic defect inspecting apparatus |
JPH01155283A (en) * | 1987-12-14 | 1989-06-19 | Hitachi Ltd | Evaluating apparatus of magnetic disk |
JPH0390881A (en) * | 1989-08-25 | 1991-04-16 | Ldj Electron Inc | Apparatus for measuring hysteresis loop of magnetic film |
JPH0494586U (en) * | 1990-12-27 | 1992-08-17 | ||
JPH0665883U (en) * | 1991-06-19 | 1994-09-16 | 有限会社アスカ電子 | Micro domain structure observation device |
JPH06109655A (en) * | 1992-09-28 | 1994-04-22 | Nippon Steel Corp | Magneto-optic defect inspecting apparatus |
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