JPS54116176A - Method of and device for measuring life time of less carriers for semiconductor - Google Patents

Method of and device for measuring life time of less carriers for semiconductor

Info

Publication number
JPS54116176A
JPS54116176A JP2200778A JP2200778A JPS54116176A JP S54116176 A JPS54116176 A JP S54116176A JP 2200778 A JP2200778 A JP 2200778A JP 2200778 A JP2200778 A JP 2200778A JP S54116176 A JPS54116176 A JP S54116176A
Authority
JP
Japan
Prior art keywords
semiconductor
life time
less carriers
measuring life
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2200778A
Other languages
Japanese (ja)
Other versions
JPS567295B2 (en
Inventor
Akira Usami
Nobuyuki Shimizu
Shinichi Kamidate
Masahiro Katou
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON SILICONE KK
Mitsubishi Metal Corp
Original Assignee
NIPPON SILICONE KK
Mitsubishi Metal Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIPPON SILICONE KK, Mitsubishi Metal Corp filed Critical NIPPON SILICONE KK
Priority to JP2200778A priority Critical patent/JPS54116176A/en
Publication of JPS54116176A publication Critical patent/JPS54116176A/en
Publication of JPS567295B2 publication Critical patent/JPS567295B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2200778A 1978-03-01 1978-03-01 Method of and device for measuring life time of less carriers for semiconductor Granted JPS54116176A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2200778A JPS54116176A (en) 1978-03-01 1978-03-01 Method of and device for measuring life time of less carriers for semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2200778A JPS54116176A (en) 1978-03-01 1978-03-01 Method of and device for measuring life time of less carriers for semiconductor

Publications (2)

Publication Number Publication Date
JPS54116176A true JPS54116176A (en) 1979-09-10
JPS567295B2 JPS567295B2 (en) 1981-02-17

Family

ID=12070936

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2200778A Granted JPS54116176A (en) 1978-03-01 1978-03-01 Method of and device for measuring life time of less carriers for semiconductor

Country Status (1)

Country Link
JP (1) JPS54116176A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016188873A (en) * 2012-07-20 2016-11-04 プレジデント・アンド・フェロウズ・オブ・ハーバード・カレッジ Fourier transform microwave spectroscopy for enantiomer-specific detection of chiral molecule

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016188873A (en) * 2012-07-20 2016-11-04 プレジデント・アンド・フェロウズ・オブ・ハーバード・カレッジ Fourier transform microwave spectroscopy for enantiomer-specific detection of chiral molecule

Also Published As

Publication number Publication date
JPS567295B2 (en) 1981-02-17

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