JPS5411168U - - Google Patents

Info

Publication number
JPS5411168U
JPS5411168U JP8401977U JP8401977U JPS5411168U JP S5411168 U JPS5411168 U JP S5411168U JP 8401977 U JP8401977 U JP 8401977U JP 8401977 U JP8401977 U JP 8401977U JP S5411168 U JPS5411168 U JP S5411168U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8401977U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8401977U priority Critical patent/JPS5411168U/ja
Publication of JPS5411168U publication Critical patent/JPS5411168U/ja
Pending legal-status Critical Current

Links

JP8401977U 1977-06-24 1977-06-24 Pending JPS5411168U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8401977U JPS5411168U (enExample) 1977-06-24 1977-06-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8401977U JPS5411168U (enExample) 1977-06-24 1977-06-24

Publications (1)

Publication Number Publication Date
JPS5411168U true JPS5411168U (enExample) 1979-01-24

Family

ID=29006325

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8401977U Pending JPS5411168U (enExample) 1977-06-24 1977-06-24

Country Status (1)

Country Link
JP (1) JPS5411168U (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013175773A (ja) * 2007-06-01 2013-09-05 Fairchild Semiconductor Corp 光センサ及び物体の光学的検出方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013175773A (ja) * 2007-06-01 2013-09-05 Fairchild Semiconductor Corp 光センサ及び物体の光学的検出方法

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