JPS5394567U - - Google Patents
Info
- Publication number
- JPS5394567U JPS5394567U JP17720476U JP17720476U JPS5394567U JP S5394567 U JPS5394567 U JP S5394567U JP 17720476 U JP17720476 U JP 17720476U JP 17720476 U JP17720476 U JP 17720476U JP S5394567 U JPS5394567 U JP S5394567U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17720476U JPS5394567U (enExample) | 1976-12-29 | 1976-12-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17720476U JPS5394567U (enExample) | 1976-12-29 | 1976-12-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5394567U true JPS5394567U (enExample) | 1978-08-01 |
Family
ID=28784494
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17720476U Pending JPS5394567U (enExample) | 1976-12-29 | 1976-12-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5394567U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58221174A (ja) * | 1982-06-18 | 1983-12-22 | Oki Electric Ind Co Ltd | 半導体装置の試験方法 |
-
1976
- 1976-12-29 JP JP17720476U patent/JPS5394567U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58221174A (ja) * | 1982-06-18 | 1983-12-22 | Oki Electric Ind Co Ltd | 半導体装置の試験方法 |