JPS5382274A - Evaluation method of semiconductor device - Google Patents

Evaluation method of semiconductor device

Info

Publication number
JPS5382274A
JPS5382274A JP15753976A JP15753976A JPS5382274A JP S5382274 A JPS5382274 A JP S5382274A JP 15753976 A JP15753976 A JP 15753976A JP 15753976 A JP15753976 A JP 15753976A JP S5382274 A JPS5382274 A JP S5382274A
Authority
JP
Japan
Prior art keywords
semiconductor device
evaluation method
diode
forward characteristics
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15753976A
Other languages
English (en)
Japanese (ja)
Other versions
JPS546868B2 (enrdf_load_stackoverflow
Inventor
Akira Honma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP15753976A priority Critical patent/JPS5382274A/ja
Publication of JPS5382274A publication Critical patent/JPS5382274A/ja
Publication of JPS546868B2 publication Critical patent/JPS546868B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP15753976A 1976-12-28 1976-12-28 Evaluation method of semiconductor device Granted JPS5382274A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15753976A JPS5382274A (en) 1976-12-28 1976-12-28 Evaluation method of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15753976A JPS5382274A (en) 1976-12-28 1976-12-28 Evaluation method of semiconductor device

Publications (2)

Publication Number Publication Date
JPS5382274A true JPS5382274A (en) 1978-07-20
JPS546868B2 JPS546868B2 (enrdf_load_stackoverflow) 1979-04-02

Family

ID=15651881

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15753976A Granted JPS5382274A (en) 1976-12-28 1976-12-28 Evaluation method of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5382274A (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4430441Y1 (enrdf_load_stackoverflow) * 1967-02-27 1969-12-15

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4430441Y1 (enrdf_load_stackoverflow) * 1967-02-27 1969-12-15

Also Published As

Publication number Publication date
JPS546868B2 (enrdf_load_stackoverflow) 1979-04-02

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