JPS5373869U - - Google Patents

Info

Publication number
JPS5373869U
JPS5373869U JP15729076U JP15729076U JPS5373869U JP S5373869 U JPS5373869 U JP S5373869U JP 15729076 U JP15729076 U JP 15729076U JP 15729076 U JP15729076 U JP 15729076U JP S5373869 U JPS5373869 U JP S5373869U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15729076U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15729076U priority Critical patent/JPS5373869U/ja
Publication of JPS5373869U publication Critical patent/JPS5373869U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP15729076U 1976-11-22 1976-11-22 Pending JPS5373869U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15729076U JPS5373869U (enrdf_load_stackoverflow) 1976-11-22 1976-11-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15729076U JPS5373869U (enrdf_load_stackoverflow) 1976-11-22 1976-11-22

Publications (1)

Publication Number Publication Date
JPS5373869U true JPS5373869U (enrdf_load_stackoverflow) 1978-06-20

Family

ID=28765324

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15729076U Pending JPS5373869U (enrdf_load_stackoverflow) 1976-11-22 1976-11-22

Country Status (1)

Country Link
JP (1) JPS5373869U (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6387803A (ja) * 1986-10-01 1988-04-19 Matsushita Electric Ind Co Ltd トランジスタ特性の測定方法
JPS63201574A (ja) * 1987-02-17 1988-08-19 Nec Corp 超高周波帯回路素子用検査治具
JPH0459484U (enrdf_load_stackoverflow) * 1990-09-28 1992-05-21
WO2023199706A1 (ja) * 2022-04-11 2023-10-19 日本メクトロン株式会社 検査治具および検査治具の特性インピーダンスの調整方法
JP2023155883A (ja) * 2022-04-11 2023-10-23 日本メクトロン株式会社 検査治具

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6387803A (ja) * 1986-10-01 1988-04-19 Matsushita Electric Ind Co Ltd トランジスタ特性の測定方法
JPS63201574A (ja) * 1987-02-17 1988-08-19 Nec Corp 超高周波帯回路素子用検査治具
JPH0459484U (enrdf_load_stackoverflow) * 1990-09-28 1992-05-21
WO2023199706A1 (ja) * 2022-04-11 2023-10-19 日本メクトロン株式会社 検査治具および検査治具の特性インピーダンスの調整方法
JP2023155883A (ja) * 2022-04-11 2023-10-23 日本メクトロン株式会社 検査治具

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