JPS5373869U - - Google Patents
Info
- Publication number
- JPS5373869U JPS5373869U JP15729076U JP15729076U JPS5373869U JP S5373869 U JPS5373869 U JP S5373869U JP 15729076 U JP15729076 U JP 15729076U JP 15729076 U JP15729076 U JP 15729076U JP S5373869 U JPS5373869 U JP S5373869U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15729076U JPS5373869U (cs) | 1976-11-22 | 1976-11-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15729076U JPS5373869U (cs) | 1976-11-22 | 1976-11-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5373869U true JPS5373869U (cs) | 1978-06-20 |
Family
ID=28765324
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15729076U Pending JPS5373869U (cs) | 1976-11-22 | 1976-11-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5373869U (cs) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6387803A (ja) * | 1986-10-01 | 1988-04-19 | Matsushita Electric Ind Co Ltd | トランジスタ特性の測定方法 |
| JPS63201574A (ja) * | 1987-02-17 | 1988-08-19 | Nec Corp | 超高周波帯回路素子用検査治具 |
| JPH0459484U (cs) * | 1990-09-28 | 1992-05-21 | ||
| WO2023199706A1 (ja) * | 2022-04-11 | 2023-10-19 | 日本メクトロン株式会社 | 検査治具および検査治具の特性インピーダンスの調整方法 |
| JP2023155883A (ja) * | 2022-04-11 | 2023-10-23 | 日本メクトロン株式会社 | 検査治具 |
-
1976
- 1976-11-22 JP JP15729076U patent/JPS5373869U/ja active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6387803A (ja) * | 1986-10-01 | 1988-04-19 | Matsushita Electric Ind Co Ltd | トランジスタ特性の測定方法 |
| JPS63201574A (ja) * | 1987-02-17 | 1988-08-19 | Nec Corp | 超高周波帯回路素子用検査治具 |
| JPH0459484U (cs) * | 1990-09-28 | 1992-05-21 | ||
| WO2023199706A1 (ja) * | 2022-04-11 | 2023-10-19 | 日本メクトロン株式会社 | 検査治具および検査治具の特性インピーダンスの調整方法 |
| JP2023155883A (ja) * | 2022-04-11 | 2023-10-23 | 日本メクトロン株式会社 | 検査治具 |