JPS5357892A - Scanning apparatus of tandem probe at flaw inspecting apparatus byultrasonic wave - Google Patents

Scanning apparatus of tandem probe at flaw inspecting apparatus byultrasonic wave

Info

Publication number
JPS5357892A
JPS5357892A JP13280776A JP13280776A JPS5357892A JP S5357892 A JPS5357892 A JP S5357892A JP 13280776 A JP13280776 A JP 13280776A JP 13280776 A JP13280776 A JP 13280776A JP S5357892 A JPS5357892 A JP S5357892A
Authority
JP
Japan
Prior art keywords
byultrasonic
wave
probe
scanning
tandem
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13280776A
Other languages
Japanese (ja)
Inventor
Akiro Sanemori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP13280776A priority Critical patent/JPS5357892A/en
Publication of JPS5357892A publication Critical patent/JPS5357892A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To scan the focus of tandem probe along preliminary given open welded face, by moving and scanning the probe for reception and the probe for transmission, so as the mutual speed to be primary functional ratio.
COPYRIGHT: (C)1978,JPO&Japio
JP13280776A 1976-11-04 1976-11-04 Scanning apparatus of tandem probe at flaw inspecting apparatus byultrasonic wave Pending JPS5357892A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13280776A JPS5357892A (en) 1976-11-04 1976-11-04 Scanning apparatus of tandem probe at flaw inspecting apparatus byultrasonic wave

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13280776A JPS5357892A (en) 1976-11-04 1976-11-04 Scanning apparatus of tandem probe at flaw inspecting apparatus byultrasonic wave

Publications (1)

Publication Number Publication Date
JPS5357892A true JPS5357892A (en) 1978-05-25

Family

ID=15090028

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13280776A Pending JPS5357892A (en) 1976-11-04 1976-11-04 Scanning apparatus of tandem probe at flaw inspecting apparatus byultrasonic wave

Country Status (1)

Country Link
JP (1) JPS5357892A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50115583A (en) * 1974-02-21 1975-09-10

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50115583A (en) * 1974-02-21 1975-09-10

Similar Documents

Publication Publication Date Title
JPS5353393A (en) Ultrasonic probe
JPS5225575A (en) Inspection method of the state of object
JPS5266485A (en) Scar searching apparatus
JPS5357892A (en) Scanning apparatus of tandem probe at flaw inspecting apparatus byultrasonic wave
JPS5350884A (en) Ultrasonic wave probe apparatus
JPS51140779A (en) Ultrasonic flaw detecting method
JPS51124993A (en) Automatic examination device for cell
JPS5292778A (en) Section indicating apparatus in use of ultrasonic wave
JPS5357893A (en) Inspecting apparatus of flaw by ultrasonic wave
JPS53143292A (en) Non-destructive inspecting method of expander joint portions of heat exchangers
JPS53140088A (en) Flaw detection using eddy current
JPS5238992A (en) Continous flaw identification method for steel products
JPS5411843A (en) Method of and apparatus for underwater welding
JPS5323690A (en) Measuring method for nitrogen oxides
JPS52104285A (en) Ultrasonic reflectoscope
JPS5393084A (en) Ultrasonic inspection probe by surface wave method
JPS52116282A (en) Probe for ultrasonic flaw detection
JPS5411793A (en) Immersion type oblique flaw detecting method and apparatus for the same
JPS52104282A (en) Detection method of scaratches on surface of intermmediate metal mater ials
JPS5373188A (en) Displaying method for ultrasonic waves dislocation image
JPS52134491A (en) Ultrasonic defect scanning method
JPS53100285A (en) Ultrasonic probe device
JPS5342094A (en) Defect length measuring device
JPS5441783A (en) Method and apparatus for detection of ultrasonic wave receiving signals
JPS51142311A (en) Method for examining a visual function by leadinga visual line in an o phthalmological instrument