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Hitachi Ltd
Original Assignee
Hitachi Ltd
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Publication date
Application filed by Hitachi LtdfiledCriticalHitachi Ltd
Priority to JP51115858ApriorityCriticalpatent/JPS5824728B2/en
Publication of JPS5342094ApublicationCriticalpatent/JPS5342094A/en
Publication of JPS5824728B2publicationCriticalpatent/JPS5824728B2/en
Length Measuring Devices Characterised By Use Of Acoustic Means
(AREA)
Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves
(AREA)
Abstract
PURPOSE: To provide the true defect length by using transformation table and correcting the apparent defect length of sample surface given by ultrasonic inspector.
COPYRIGHT: (C)1978,JPO&Japio
JP51115858A1976-09-291976-09-29
Defect length measurement method and device
ExpiredJPS5824728B2
(en)