JPS5355050A - Inspecting method of phase plate - Google Patents

Inspecting method of phase plate

Info

Publication number
JPS5355050A
JPS5355050A JP12933676A JP12933676A JPS5355050A JP S5355050 A JPS5355050 A JP S5355050A JP 12933676 A JP12933676 A JP 12933676A JP 12933676 A JP12933676 A JP 12933676A JP S5355050 A JPS5355050 A JP S5355050A
Authority
JP
Japan
Prior art keywords
phase plate
inspecting method
lights
comparting
bisecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12933676A
Other languages
Japanese (ja)
Other versions
JPS5933210B2 (en
Inventor
Toru Musha
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP12933676A priority Critical patent/JPS5933210B2/en
Publication of JPS5355050A publication Critical patent/JPS5355050A/en
Publication of JPS5933210B2 publication Critical patent/JPS5933210B2/en
Expired legal-status Critical Current

Links

Abstract

PURPOSE: To automatically electrically perform the retardation inspection of phase plates by bisecting counterclockwise and clockwise circularly polarized lights of two wavelengths and comparting the phases of the lights received through required optical elements.
COPYRIGHT: (C)1978,JPO&Japio
JP12933676A 1976-10-29 1976-10-29 Phase plate inspection method Expired JPS5933210B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12933676A JPS5933210B2 (en) 1976-10-29 1976-10-29 Phase plate inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12933676A JPS5933210B2 (en) 1976-10-29 1976-10-29 Phase plate inspection method

Publications (2)

Publication Number Publication Date
JPS5355050A true JPS5355050A (en) 1978-05-19
JPS5933210B2 JPS5933210B2 (en) 1984-08-14

Family

ID=15007077

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12933676A Expired JPS5933210B2 (en) 1976-10-29 1976-10-29 Phase plate inspection method

Country Status (1)

Country Link
JP (1) JPS5933210B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0340995A2 (en) * 1988-05-04 1989-11-08 Simmonds Precision Products Inc. Apparatus and methods for testing optical devices
CN103196658A (en) * 2013-04-19 2013-07-10 山东大学 Method and device for measuring phase delay spectral characteristic of wave plate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0340995A2 (en) * 1988-05-04 1989-11-08 Simmonds Precision Products Inc. Apparatus and methods for testing optical devices
CN103196658A (en) * 2013-04-19 2013-07-10 山东大学 Method and device for measuring phase delay spectral characteristic of wave plate

Also Published As

Publication number Publication date
JPS5933210B2 (en) 1984-08-14

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