JPS5340583A - Inspecting apparatus for bottle.s bottom - Google Patents

Inspecting apparatus for bottle.s bottom

Info

Publication number
JPS5340583A
JPS5340583A JP11084376A JP11084376A JPS5340583A JP S5340583 A JPS5340583 A JP S5340583A JP 11084376 A JP11084376 A JP 11084376A JP 11084376 A JP11084376 A JP 11084376A JP S5340583 A JPS5340583 A JP S5340583A
Authority
JP
Japan
Prior art keywords
bottle
inspecting apparatus
freely
filling
influence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11084376A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5627822B2 (enExample
Inventor
Akihiko Iwata
Yoshiaki Tomita
Noburo Sato
Yoshinori Mima
Yoji Sugano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sapporo Breweries Ltd
Hitachi Ltd
Kokusai Denki Electric Inc
Original Assignee
Hitachi Denshi KK
Sapporo Breweries Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Denshi KK, Sapporo Breweries Ltd, Hitachi Ltd filed Critical Hitachi Denshi KK
Priority to JP11084376A priority Critical patent/JPS5340583A/ja
Publication of JPS5340583A publication Critical patent/JPS5340583A/ja
Publication of JPS5627822B2 publication Critical patent/JPS5627822B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9045—Inspection of ornamented or stippled container walls

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP11084376A 1976-09-17 1976-09-17 Inspecting apparatus for bottle.s bottom Granted JPS5340583A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11084376A JPS5340583A (en) 1976-09-17 1976-09-17 Inspecting apparatus for bottle.s bottom

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11084376A JPS5340583A (en) 1976-09-17 1976-09-17 Inspecting apparatus for bottle.s bottom

Publications (2)

Publication Number Publication Date
JPS5340583A true JPS5340583A (en) 1978-04-13
JPS5627822B2 JPS5627822B2 (enExample) 1981-06-27

Family

ID=14546061

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11084376A Granted JPS5340583A (en) 1976-09-17 1976-09-17 Inspecting apparatus for bottle.s bottom

Country Status (1)

Country Link
JP (1) JPS5340583A (enExample)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5550144A (en) * 1978-10-07 1980-04-11 Hajime Sangyo Kk Photoelectric tester
US4431262A (en) * 1981-10-06 1984-02-14 Tolles Walter E Conformable optical couplers
JPS60155940A (ja) * 1984-01-25 1985-08-16 Matsushita Electric Ind Co Ltd 透光性光学体の光学欠陥検出法
JPS60224706A (ja) * 1984-04-20 1985-11-09 Hitachi Ltd 金属超微粒子の製造法
JPH01306510A (ja) * 1988-06-02 1989-12-11 Nisshin Flour Milling Co Ltd 超微粒子粉末の製造方法の改良
JPH02205603A (ja) * 1989-01-31 1990-08-15 Idemitsu Petrochem Co Ltd 超微粒子の製造方法、磁性超微粒子及び磁性材料
US5301238A (en) * 1990-07-13 1994-04-05 Elpatronic Ag Process for reading a chain of code characters from a transparent bottle
EP0647846A1 (de) * 1993-10-08 1995-04-12 Elpatronic Ag Verfahren und Anordnung zur Inspektion lichtdurchlässiger Gegenstände

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5550144A (en) * 1978-10-07 1980-04-11 Hajime Sangyo Kk Photoelectric tester
US4431262A (en) * 1981-10-06 1984-02-14 Tolles Walter E Conformable optical couplers
JPS60155940A (ja) * 1984-01-25 1985-08-16 Matsushita Electric Ind Co Ltd 透光性光学体の光学欠陥検出法
JPS60224706A (ja) * 1984-04-20 1985-11-09 Hitachi Ltd 金属超微粒子の製造法
JPH01306510A (ja) * 1988-06-02 1989-12-11 Nisshin Flour Milling Co Ltd 超微粒子粉末の製造方法の改良
JPH02205603A (ja) * 1989-01-31 1990-08-15 Idemitsu Petrochem Co Ltd 超微粒子の製造方法、磁性超微粒子及び磁性材料
US5301238A (en) * 1990-07-13 1994-04-05 Elpatronic Ag Process for reading a chain of code characters from a transparent bottle
EP0647846A1 (de) * 1993-10-08 1995-04-12 Elpatronic Ag Verfahren und Anordnung zur Inspektion lichtdurchlässiger Gegenstände
US5528026A (en) * 1993-10-08 1996-06-18 Elpatronic Ag Process and arrangement for the inspection of translucent articles

Also Published As

Publication number Publication date
JPS5627822B2 (enExample) 1981-06-27

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