JPS5339178A - Method and apparatus for measuring of thermal luminescence dose - Google Patents

Method and apparatus for measuring of thermal luminescence dose

Info

Publication number
JPS5339178A
JPS5339178A JP11392676A JP11392676A JPS5339178A JP S5339178 A JPS5339178 A JP S5339178A JP 11392676 A JP11392676 A JP 11392676A JP 11392676 A JP11392676 A JP 11392676A JP S5339178 A JPS5339178 A JP S5339178A
Authority
JP
Japan
Prior art keywords
measuring
thermal luminescence
luminescence dose
thermal
dose
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11392676A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6142233B2 (enrdf_load_stackoverflow
Inventor
Yoshitake Yasuno
Masabumi Watari
Hiroshi Tsutsui
Toshi Ikedo
Osamu Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP11392676A priority Critical patent/JPS5339178A/ja
Priority to DE19772742556 priority patent/DE2742556A1/de
Priority to CA287,196A priority patent/CA1089120A/en
Priority to FR7728505A priority patent/FR2365809A1/fr
Priority to US05/835,341 priority patent/US4204119A/en
Priority to GB39614/77A priority patent/GB1587267A/en
Publication of JPS5339178A publication Critical patent/JPS5339178A/ja
Publication of JPS6142233B2 publication Critical patent/JPS6142233B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Radiation (AREA)
JP11392676A 1976-09-22 1976-09-22 Method and apparatus for measuring of thermal luminescence dose Granted JPS5339178A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP11392676A JPS5339178A (en) 1976-09-22 1976-09-22 Method and apparatus for measuring of thermal luminescence dose
DE19772742556 DE2742556A1 (de) 1976-09-22 1977-09-19 Verfahren zum ablesen eines thermolumineszenten dosimeters
CA287,196A CA1089120A (en) 1976-09-22 1977-09-21 Method of reading thermoluminescent dosimeter
FR7728505A FR2365809A1 (fr) 1976-09-22 1977-09-21 Dosimetre a thermoluminescence et procede de lecture d'un tel dosimetre
US05/835,341 US4204119A (en) 1976-09-22 1977-09-21 Method of reading thermoluminescent dosimeter
GB39614/77A GB1587267A (en) 1976-09-22 1977-09-22 Dosimeters

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11392676A JPS5339178A (en) 1976-09-22 1976-09-22 Method and apparatus for measuring of thermal luminescence dose

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP61071520A Division JPS61215983A (ja) 1986-03-28 1986-03-28 熱ルミネツセンス線量測定方法

Publications (2)

Publication Number Publication Date
JPS5339178A true JPS5339178A (en) 1978-04-10
JPS6142233B2 JPS6142233B2 (enrdf_load_stackoverflow) 1986-09-19

Family

ID=14624644

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11392676A Granted JPS5339178A (en) 1976-09-22 1976-09-22 Method and apparatus for measuring of thermal luminescence dose

Country Status (1)

Country Link
JP (1) JPS5339178A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5472909A (en) * 1993-05-21 1995-12-05 Naoetsu Electronics Company Method for the preparation of discrete substrate plates of semiconductor silicon wafer
JPWO2022114130A1 (enrdf_load_stackoverflow) * 2020-11-27 2022-06-02

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5472909A (en) * 1993-05-21 1995-12-05 Naoetsu Electronics Company Method for the preparation of discrete substrate plates of semiconductor silicon wafer
JPWO2022114130A1 (enrdf_load_stackoverflow) * 2020-11-27 2022-06-02
WO2022114130A1 (ja) * 2020-11-27 2022-06-02 東京都公立大学法人 熱蛍光測定方法及び熱蛍光測定装置

Also Published As

Publication number Publication date
JPS6142233B2 (enrdf_load_stackoverflow) 1986-09-19

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