JPS5338948B2 - - Google Patents
Info
- Publication number
- JPS5338948B2 JPS5338948B2 JP8607972A JP8607972A JPS5338948B2 JP S5338948 B2 JPS5338948 B2 JP S5338948B2 JP 8607972 A JP8607972 A JP 8607972A JP 8607972 A JP8607972 A JP 8607972A JP S5338948 B2 JPS5338948 B2 JP S5338948B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/282—Static spectrometers using electrostatic analysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/482—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with cylindrical mirrors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/484—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with spherical mirrors
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US17557571A | 1971-08-27 | 1971-08-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4832589A JPS4832589A (cs) | 1973-04-28 |
| JPS5338948B2 true JPS5338948B2 (cs) | 1978-10-18 |
Family
ID=22640776
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8607972A Expired JPS5338948B2 (cs) | 1971-08-27 | 1972-08-28 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3699331A (cs) |
| JP (1) | JPS5338948B2 (cs) |
| FR (1) | FR2150887B1 (cs) |
| GB (1) | GB1338208A (cs) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1327572A (en) * | 1971-03-23 | 1973-08-22 | Ass Elect Ind | Apparatus for use in charged particle spectroscopy |
| US3870882A (en) * | 1973-05-23 | 1975-03-11 | Gca Corp | Esca x-ray source |
| JPS5831700B2 (ja) * | 1975-06-06 | 1983-07-07 | ニホンシンクウギジユツ カブシキガイシヤ | イオンシツリヨウブンセキソウチ |
| US4048498A (en) * | 1976-09-01 | 1977-09-13 | Physical Electronics Industries, Inc. | Scanning auger microprobe with variable axial aperture |
| JPS597736Y2 (ja) * | 1977-02-25 | 1984-03-09 | 日本電子株式会社 | 電子分光装置 |
| DE2851743C2 (de) * | 1978-11-30 | 1980-08-28 | Kernforschungsanlage Juelich Gmbh, 5170 Juelich | ElektronenstoBspektrometer |
| US4224518A (en) * | 1978-12-21 | 1980-09-23 | Varian Associates, Inc. | Multistage cylindrical mirror analyzer incorporating a coaxial electron gun |
| US4367406A (en) * | 1981-01-13 | 1983-01-04 | Trustees Of Boston University | Cylindrical mirror electrostatic energy analyzer free of third-order angular aberrations |
| US5032724A (en) * | 1990-08-09 | 1991-07-16 | The Perkin-Elmer Corporation | Multichannel charged-particle analyzer |
| US6184523B1 (en) * | 1998-07-14 | 2001-02-06 | Board Of Regents Of The University Of Nebraska | High resolution charged particle-energy detecting, multiple sequential stage, compact, small diameter, retractable cylindrical mirror analyzer system, and method of use |
| WO2008114684A1 (ja) * | 2007-03-16 | 2008-09-25 | National University Corporation NARA Institute of Science and Technology | エネルギー分析器、２次元表示型エネルギー分析器および光電子顕微鏡 |
| GB0720901D0 (en) * | 2007-10-24 | 2007-12-05 | Shimadzu Res Lab Europe Ltd | Charged particle energy analysers |
| US8071942B2 (en) | 2009-03-20 | 2011-12-06 | Physical Electronics USA, Inc. | Sample holder apparatus to reduce energy of electrons in an analyzer system and method |
| CN102484027A (zh) * | 2009-07-17 | 2012-05-30 | 克拉-坦科股份有限公司 | 带电粒子能量分析器 |
| CN106568832A (zh) * | 2016-10-31 | 2017-04-19 | 中国科学院国家空间科学中心 | 一种用于空间热等离子体能量和成分测量的传感器装置 |
| CN110618443B (zh) * | 2019-08-26 | 2021-04-13 | 北京控制工程研究所 | 一种等离子体推力器稳态离子流场测量装置及测量方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3582649A (en) * | 1968-10-21 | 1971-06-01 | Varian Associates | Retarding field electron diffraction spectrometer having improved resolution |
| US3596091A (en) * | 1969-05-19 | 1971-07-27 | Varian Associates | Induced electron emission spectrometer having a unipotential sample chamber |
| US3631238A (en) * | 1969-11-17 | 1971-12-28 | North American Rockwell | Method of measuring electric potential on an object surface using auger electron spectroscopy |
-
1971
- 1971-08-27 US US175575A patent/US3699331A/en not_active Expired - Lifetime
-
1972
- 1972-08-04 GB GB3659672A patent/GB1338208A/en not_active Expired
- 1972-08-25 FR FR7230444A patent/FR2150887B1/fr not_active Expired
- 1972-08-28 JP JP8607972A patent/JPS5338948B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| FR2150887B1 (cs) | 1976-08-13 |
| GB1338208A (en) | 1973-11-21 |
| JPS4832589A (cs) | 1973-04-28 |
| DE2241612B2 (de) | 1976-01-15 |
| DE2241612A1 (de) | 1973-03-08 |
| FR2150887A1 (cs) | 1973-04-13 |
| US3699331A (en) | 1972-10-17 |