JPS5338947B2 - - Google Patents
Info
- Publication number
- JPS5338947B2 JPS5338947B2 JP8443172A JP8443172A JPS5338947B2 JP S5338947 B2 JPS5338947 B2 JP S5338947B2 JP 8443172 A JP8443172 A JP 8443172A JP 8443172 A JP8443172 A JP 8443172A JP S5338947 B2 JPS5338947 B2 JP S5338947B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/482—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with cylindrical mirrors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/488—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with retarding grids
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US17563371A | 1971-08-27 | 1971-08-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4832588A JPS4832588A (en:Method) | 1973-04-28 |
| JPS5338947B2 true JPS5338947B2 (en:Method) | 1978-10-18 |
Family
ID=22641020
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8443172A Expired JPS5338947B2 (en:Method) | 1971-08-27 | 1972-08-23 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3735128A (en:Method) |
| JP (1) | JPS5338947B2 (en:Method) |
| FR (1) | FR2150886B1 (en:Method) |
| GB (1) | GB1338209A (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS574168U (en:Method) * | 1980-06-06 | 1982-01-09 |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL7306378A (en:Method) * | 1973-05-08 | 1974-11-12 | ||
| US3818228A (en) * | 1973-08-17 | 1974-06-18 | Physical Electronics Ind Inc | Field termination plates for charged particle analyzers |
| US4107526A (en) * | 1976-03-22 | 1978-08-15 | Minnesota Mining And Manufacturing Company | Ion scattering spectrometer with modified bias |
| US4048498A (en) * | 1976-09-01 | 1977-09-13 | Physical Electronics Industries, Inc. | Scanning auger microprobe with variable axial aperture |
| JPS597736Y2 (ja) * | 1977-02-25 | 1984-03-09 | 日本電子株式会社 | 電子分光装置 |
| US4239966A (en) * | 1979-08-29 | 1980-12-16 | Wang Chia G | Detection of atoms using monochromatic X-rays |
| US4367406A (en) * | 1981-01-13 | 1983-01-04 | Trustees Of Boston University | Cylindrical mirror electrostatic energy analyzer free of third-order angular aberrations |
| US5097125A (en) * | 1986-06-04 | 1992-03-17 | Arch Development Corporation | Photo ion spectrometer |
| GB8617384D0 (en) * | 1986-07-16 | 1986-08-20 | Spectros Ltd | Charged particle optical systems |
| GB9220097D0 (en) * | 1992-09-23 | 1992-11-04 | Univ York | Electron spectrometers |
| US6184523B1 (en) * | 1998-07-14 | 2001-02-06 | Board Of Regents Of The University Of Nebraska | High resolution charged particle-energy detecting, multiple sequential stage, compact, small diameter, retractable cylindrical mirror analyzer system, and method of use |
| JP4763191B2 (ja) * | 1999-06-16 | 2011-08-31 | シマヅ リサーチ ラボラトリー（ヨーロッパ）リミティド | 荷電粒子エネルギ分析装置 |
| DE10117025A1 (de) * | 2001-04-05 | 2002-10-10 | Zeiss Carl | Teilchenoptische Vorrichtung,Beleuchtungsvorrichtung und Projektionssystem sowie Verfahren unter Verwendung derselben |
| WO2007053843A2 (en) * | 2005-11-01 | 2007-05-10 | The Regents Of The University Of Colorado | Multichannel energy analyzer for charged particles |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2506659A (en) * | 1941-04-11 | 1950-05-09 | Csf | Electron discharge tube |
| NL92472C (en:Method) * | 1949-03-16 | |||
| US3407323A (en) * | 1966-05-23 | 1968-10-22 | High Voltage Engineering Corp | Electrode structure for a charged particle accelerating apparatus, arrayed and biased to produce an electric field between and parallel to the electrodes |
| US3596091A (en) * | 1969-05-19 | 1971-07-27 | Varian Associates | Induced electron emission spectrometer having a unipotential sample chamber |
-
1971
- 1971-08-27 US US00175633A patent/US3735128A/en not_active Expired - Lifetime
-
1972
- 1972-08-01 GB GB3595172A patent/GB1338209A/en not_active Expired
- 1972-08-23 JP JP8443172A patent/JPS5338947B2/ja not_active Expired
- 1972-08-25 FR FR7230443A patent/FR2150886B1/fr not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS574168U (en:Method) * | 1980-06-06 | 1982-01-09 |
Also Published As
| Publication number | Publication date |
|---|---|
| FR2150886A1 (en:Method) | 1973-04-13 |
| GB1338209A (en) | 1973-11-21 |
| FR2150886B1 (en:Method) | 1978-02-10 |
| US3735128A (en) | 1973-05-22 |
| JPS4832588A (en:Method) | 1973-04-28 |
| DE2241613A1 (de) | 1973-03-08 |
| DE2241613B2 (de) | 1977-03-31 |