JPS5338947B2 - - Google Patents

Info

Publication number
JPS5338947B2
JPS5338947B2 JP8443172A JP8443172A JPS5338947B2 JP S5338947 B2 JPS5338947 B2 JP S5338947B2 JP 8443172 A JP8443172 A JP 8443172A JP 8443172 A JP8443172 A JP 8443172A JP S5338947 B2 JPS5338947 B2 JP S5338947B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8443172A
Other languages
Japanese (ja)
Other versions
JPS4832588A (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4832588A publication Critical patent/JPS4832588A/ja
Publication of JPS5338947B2 publication Critical patent/JPS5338947B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H01J49/482—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with cylindrical mirrors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H01J49/488—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with retarding grids

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
  • Measurement Of Radiation (AREA)
JP8443172A 1971-08-27 1972-08-23 Expired JPS5338947B2 (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US17563371A 1971-08-27 1971-08-27

Publications (2)

Publication Number Publication Date
JPS4832588A JPS4832588A (enrdf_load_stackoverflow) 1973-04-28
JPS5338947B2 true JPS5338947B2 (enrdf_load_stackoverflow) 1978-10-18

Family

ID=22641020

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8443172A Expired JPS5338947B2 (enrdf_load_stackoverflow) 1971-08-27 1972-08-23

Country Status (4)

Country Link
US (1) US3735128A (enrdf_load_stackoverflow)
JP (1) JPS5338947B2 (enrdf_load_stackoverflow)
FR (1) FR2150886B1 (enrdf_load_stackoverflow)
GB (1) GB1338209A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS574168U (enrdf_load_stackoverflow) * 1980-06-06 1982-01-09

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7306378A (enrdf_load_stackoverflow) * 1973-05-08 1974-11-12
US3818228A (en) * 1973-08-17 1974-06-18 Physical Electronics Ind Inc Field termination plates for charged particle analyzers
US4107526A (en) * 1976-03-22 1978-08-15 Minnesota Mining And Manufacturing Company Ion scattering spectrometer with modified bias
US4048498A (en) * 1976-09-01 1977-09-13 Physical Electronics Industries, Inc. Scanning auger microprobe with variable axial aperture
JPS597736Y2 (ja) * 1977-02-25 1984-03-09 日本電子株式会社 電子分光装置
US4239966A (en) * 1979-08-29 1980-12-16 Wang Chia G Detection of atoms using monochromatic X-rays
US4367406A (en) * 1981-01-13 1983-01-04 Trustees Of Boston University Cylindrical mirror electrostatic energy analyzer free of third-order angular aberrations
US5097125A (en) * 1986-06-04 1992-03-17 Arch Development Corporation Photo ion spectrometer
GB8617384D0 (en) * 1986-07-16 1986-08-20 Spectros Ltd Charged particle optical systems
GB9220097D0 (en) * 1992-09-23 1992-11-04 Univ York Electron spectrometers
US6184523B1 (en) * 1998-07-14 2001-02-06 Board Of Regents Of The University Of Nebraska High resolution charged particle-energy detecting, multiple sequential stage, compact, small diameter, retractable cylindrical mirror analyzer system, and method of use
JP4763191B2 (ja) * 1999-06-16 2011-08-31 シマヅ リサーチ ラボラトリー（ヨーロッパ）リミティド 荷電粒子エネルギ分析装置
DE10117025A1 (de) * 2001-04-05 2002-10-10 Zeiss Carl Teilchenoptische Vorrichtung,Beleuchtungsvorrichtung und Projektionssystem sowie Verfahren unter Verwendung derselben
US7902502B2 (en) * 2005-11-01 2011-03-08 The Regents Of The University Of Colorado, A Body Corporate Multichannel energy analyzer for charged particles

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2506659A (en) * 1941-04-11 1950-05-09 Csf Electron discharge tube
NL86382C (enrdf_load_stackoverflow) * 1949-03-16
US3407323A (en) * 1966-05-23 1968-10-22 High Voltage Engineering Corp Electrode structure for a charged particle accelerating apparatus, arrayed and biased to produce an electric field between and parallel to the electrodes
US3596091A (en) * 1969-05-19 1971-07-27 Varian Associates Induced electron emission spectrometer having a unipotential sample chamber

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS574168U (enrdf_load_stackoverflow) * 1980-06-06 1982-01-09

Also Published As

Publication number Publication date
FR2150886B1 (enrdf_load_stackoverflow) 1978-02-10
US3735128A (en) 1973-05-22
GB1338209A (en) 1973-11-21
FR2150886A1 (enrdf_load_stackoverflow) 1973-04-13
DE2241613B2 (de) 1977-03-31
JPS4832588A (enrdf_load_stackoverflow) 1973-04-28
DE2241613A1 (de) 1973-03-08

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