JPS5333504Y2 - - Google Patents
Info
- Publication number
- JPS5333504Y2 JPS5333504Y2 JP1977028032U JP2803277U JPS5333504Y2 JP S5333504 Y2 JPS5333504 Y2 JP S5333504Y2 JP 1977028032 U JP1977028032 U JP 1977028032U JP 2803277 U JP2803277 U JP 2803277U JP S5333504 Y2 JPS5333504 Y2 JP S5333504Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1977028032U JPS5333504Y2 (he) | 1977-03-10 | 1977-03-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1977028032U JPS5333504Y2 (he) | 1977-03-10 | 1977-03-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS52113773U JPS52113773U (he) | 1977-08-29 |
| JPS5333504Y2 true JPS5333504Y2 (he) | 1978-08-17 |
Family
ID=28487718
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1977028032U Expired JPS5333504Y2 (he) | 1977-03-10 | 1977-03-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5333504Y2 (he) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2531043Y2 (ja) * | 1990-09-28 | 1997-04-02 | アンリツ株式会社 | プローブヘッドの先端構造 |
| JP2531042Y2 (ja) * | 1990-09-28 | 1997-04-02 | アンリツ株式会社 | プローブヘッド |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3445770A (en) * | 1965-12-27 | 1969-05-20 | Philco Ford Corp | Microelectronic test probe with defect marker access |
| US3508151A (en) * | 1966-04-18 | 1970-04-21 | Sprague Electric Co | Card type probe head having knob anchored contacting ends |
-
1977
- 1977-03-10 JP JP1977028032U patent/JPS5333504Y2/ja not_active Expired
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3445770A (en) * | 1965-12-27 | 1969-05-20 | Philco Ford Corp | Microelectronic test probe with defect marker access |
| US3508151A (en) * | 1966-04-18 | 1970-04-21 | Sprague Electric Co | Card type probe head having knob anchored contacting ends |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS52113773U (he) | 1977-08-29 |