JPS5333504Y2 - - Google Patents

Info

Publication number
JPS5333504Y2
JPS5333504Y2 JP1977028032U JP2803277U JPS5333504Y2 JP S5333504 Y2 JPS5333504 Y2 JP S5333504Y2 JP 1977028032 U JP1977028032 U JP 1977028032U JP 2803277 U JP2803277 U JP 2803277U JP S5333504 Y2 JPS5333504 Y2 JP S5333504Y2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1977028032U
Other languages
Japanese (ja)
Other versions
JPS52113773U (enrdf_load_html_response
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1977028032U priority Critical patent/JPS5333504Y2/ja
Publication of JPS52113773U publication Critical patent/JPS52113773U/ja
Application granted granted Critical
Publication of JPS5333504Y2 publication Critical patent/JPS5333504Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1977028032U 1977-03-10 1977-03-10 Expired JPS5333504Y2 (enrdf_load_html_response)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1977028032U JPS5333504Y2 (enrdf_load_html_response) 1977-03-10 1977-03-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1977028032U JPS5333504Y2 (enrdf_load_html_response) 1977-03-10 1977-03-10

Publications (2)

Publication Number Publication Date
JPS52113773U JPS52113773U (enrdf_load_html_response) 1977-08-29
JPS5333504Y2 true JPS5333504Y2 (enrdf_load_html_response) 1978-08-17

Family

ID=28487718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1977028032U Expired JPS5333504Y2 (enrdf_load_html_response) 1977-03-10 1977-03-10

Country Status (1)

Country Link
JP (1) JPS5333504Y2 (enrdf_load_html_response)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2531042Y2 (ja) * 1990-09-28 1997-04-02 アンリツ株式会社 プローブヘッド
JP2531043Y2 (ja) * 1990-09-28 1997-04-02 アンリツ株式会社 プローブヘッドの先端構造

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3445770A (en) * 1965-12-27 1969-05-20 Philco Ford Corp Microelectronic test probe with defect marker access
US3508151A (en) * 1966-04-18 1970-04-21 Sprague Electric Co Card type probe head having knob anchored contacting ends

Also Published As

Publication number Publication date
JPS52113773U (enrdf_load_html_response) 1977-08-29

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