JPS5333504Y2 - - Google Patents

Info

Publication number
JPS5333504Y2
JPS5333504Y2 JP1977028032U JP2803277U JPS5333504Y2 JP S5333504 Y2 JPS5333504 Y2 JP S5333504Y2 JP 1977028032 U JP1977028032 U JP 1977028032U JP 2803277 U JP2803277 U JP 2803277U JP S5333504 Y2 JPS5333504 Y2 JP S5333504Y2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1977028032U
Other languages
Japanese (ja)
Other versions
JPS52113773U (cs
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1977028032U priority Critical patent/JPS5333504Y2/ja
Publication of JPS52113773U publication Critical patent/JPS52113773U/ja
Application granted granted Critical
Publication of JPS5333504Y2 publication Critical patent/JPS5333504Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1977028032U 1977-03-10 1977-03-10 Expired JPS5333504Y2 (cs)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1977028032U JPS5333504Y2 (cs) 1977-03-10 1977-03-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1977028032U JPS5333504Y2 (cs) 1977-03-10 1977-03-10

Publications (2)

Publication Number Publication Date
JPS52113773U JPS52113773U (cs) 1977-08-29
JPS5333504Y2 true JPS5333504Y2 (cs) 1978-08-17

Family

ID=28487718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1977028032U Expired JPS5333504Y2 (cs) 1977-03-10 1977-03-10

Country Status (1)

Country Link
JP (1) JPS5333504Y2 (cs)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2531043Y2 (ja) * 1990-09-28 1997-04-02 アンリツ株式会社 プローブヘッドの先端構造
JP2531042Y2 (ja) * 1990-09-28 1997-04-02 アンリツ株式会社 プローブヘッド

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3445770A (en) * 1965-12-27 1969-05-20 Philco Ford Corp Microelectronic test probe with defect marker access
US3508151A (en) * 1966-04-18 1970-04-21 Sprague Electric Co Card type probe head having knob anchored contacting ends

Also Published As

Publication number Publication date
JPS52113773U (cs) 1977-08-29

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