JPS532748B2 - - Google Patents
Info
- Publication number
- JPS532748B2 JPS532748B2 JP14140973A JP14140973A JPS532748B2 JP S532748 B2 JPS532748 B2 JP S532748B2 JP 14140973 A JP14140973 A JP 14140973A JP 14140973 A JP14140973 A JP 14140973A JP S532748 B2 JPS532748 B2 JP S532748B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Dispersion Chemistry (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7245248A FR2210771B1 (en:Method) | 1972-12-19 | 1972-12-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4991492A JPS4991492A (en:Method) | 1974-08-31 |
| JPS532748B2 true JPS532748B2 (en:Method) | 1978-01-31 |
Family
ID=9108953
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14140973A Expired JPS532748B2 (en:Method) | 1972-12-19 | 1973-12-19 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3906225A (en:Method) |
| JP (1) | JPS532748B2 (en:Method) |
| DE (1) | DE2363221C3 (en:Method) |
| FR (1) | FR2210771B1 (en:Method) |
| GB (1) | GB1413060A (en:Method) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IT1115737B (it) * | 1977-10-19 | 1986-02-03 | Cise Spa | Spettografo-monocromatore ad incidenza radente |
| FR2600417B1 (fr) * | 1986-06-19 | 1990-01-12 | Centre Nat Rech Scient | Spectrometrie de rayons x a focalisation par cristal courbe et a chambre d'emission de rayons x polyvalente |
| EP0547695B1 (en) * | 1991-12-18 | 1997-09-03 | Koninklijke Philips Electronics N.V. | X-ray analysis apparatus |
| US7099437B2 (en) * | 2002-09-23 | 2006-08-29 | The Johns Hopkins University | Double crystal analyzer linkage |
| CN101093200B (zh) * | 2007-05-14 | 2011-06-29 | 北京逸东机电技术开发有限公司 | 一种x射线的连续衍射分光与探测的控制方法及其装置 |
| ES2911717T3 (es) * | 2015-12-28 | 2022-05-20 | Univ Washington | Métodos para alinear un espectrómetro |
| US12392912B2 (en) * | 2020-12-25 | 2025-08-19 | Toray Industries, Inc. | Scintillator panel, radiation detector, radiation inspection device, and method for producing scintillator panel |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1572753B2 (de) * | 1966-04-06 | 1971-02-18 | Nihon Denshi K K , Tokio | Goniometer zur werkstoffanalyse mittels roentgenstrahlen |
-
1972
- 1972-12-19 FR FR7245248A patent/FR2210771B1/fr not_active Expired
-
1973
- 1973-12-13 US US424425A patent/US3906225A/en not_active Expired - Lifetime
- 1973-12-19 JP JP14140973A patent/JPS532748B2/ja not_active Expired
- 1973-12-19 GB GB5896173A patent/GB1413060A/en not_active Expired
- 1973-12-19 DE DE2363221A patent/DE2363221C3/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE2363221B2 (de) | 1978-10-19 |
| JPS4991492A (en:Method) | 1974-08-31 |
| DE2363221C3 (de) | 1979-06-21 |
| US3906225A (en) | 1975-09-16 |
| GB1413060A (en) | 1975-11-05 |
| FR2210771B1 (en:Method) | 1975-03-28 |
| DE2363221A1 (de) | 1974-07-04 |
| FR2210771A1 (en:Method) | 1974-07-12 |