JPS5325792B2 - - Google Patents

Info

Publication number
JPS5325792B2
JPS5325792B2 JP5349974A JP5349974A JPS5325792B2 JP S5325792 B2 JPS5325792 B2 JP S5325792B2 JP 5349974 A JP5349974 A JP 5349974A JP 5349974 A JP5349974 A JP 5349974A JP S5325792 B2 JPS5325792 B2 JP S5325792B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP5349974A
Other languages
Japanese (ja)
Other versions
JPS5023587A (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5023587A publication Critical patent/JPS5023587A/ja
Publication of JPS5325792B2 publication Critical patent/JPS5325792B2/ja
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90Masterslice integrated circuits
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP5349974A 1973-06-04 1974-05-15 Expired JPS5325792B2 (https=)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US367093A US3879839A (en) 1973-06-04 1973-06-04 Method of manufacturing multi-function LSI wafers

Publications (2)

Publication Number Publication Date
JPS5023587A JPS5023587A (https=) 1975-03-13
JPS5325792B2 true JPS5325792B2 (https=) 1978-07-28

Family

ID=23445907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5349974A Expired JPS5325792B2 (https=) 1973-06-04 1974-05-15

Country Status (12)

Country Link
US (1) US3879839A (https=)
JP (1) JPS5325792B2 (https=)
BR (1) BR7404557D0 (https=)
CA (1) CA1009765A (https=)
CH (1) CH585000A5 (https=)
DE (1) DE2425915B2 (https=)
ES (1) ES426888A1 (https=)
FR (1) FR2232084B1 (https=)
GB (1) GB1425283A (https=)
IT (1) IT1010174B (https=)
NL (1) NL7407162A (https=)
SE (1) SE390467B (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2633324C2 (de) * 1976-07-24 1983-09-15 SEMIKRON Gesellschaft für Gleichrichterbau u. Elektronik mbH, 8500 Nürnberg Verfahren zum Herstellen von Halbleiterbauelementen hoher Sperrspannungsbelastbarkeit
JPS5430770A (en) * 1977-08-11 1979-03-07 Matsushita Electric Ind Co Ltd D-a converter
US4244048A (en) * 1978-12-29 1981-01-06 International Business Machines Corporation Chip and wafer configuration and testing method for large-scale-integrated circuits
GB2117564B (en) * 1982-03-26 1985-11-06 Int Computers Ltd Mounting one integrated circuit upon another
GB8506714D0 (en) * 1985-03-15 1985-04-17 Smiths Industries Plc Electronic circuit assemblies
US4802099A (en) * 1986-01-03 1989-01-31 International Business Machines Corporation Physical parameter balancing of circuit islands in integrated circuit wafers
US5206583A (en) * 1991-08-20 1993-04-27 International Business Machines Corporation Latch assisted fuse testing for customized integrated circuits
US7194707B2 (en) * 2004-09-17 2007-03-20 International Business Machines Corporation Method and apparatus for depopulating peripheral input/output cells

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3289046A (en) * 1964-05-19 1966-11-29 Gen Electric Component chip mounted on substrate with heater pads therebetween
US3811182A (en) * 1972-03-31 1974-05-21 Ibm Object handling fixture, system, and process
US3751799A (en) * 1972-04-26 1973-08-14 Ibm Solder terminal rework technique

Also Published As

Publication number Publication date
BR7404557D0 (pt) 1975-01-07
JPS5023587A (https=) 1975-03-13
SE390467B (sv) 1976-12-20
DE2425915B2 (de) 1978-01-19
FR2232084A1 (https=) 1974-12-27
CH585000A5 (https=) 1977-02-15
NL7407162A (https=) 1974-12-06
DE2425915A1 (de) 1974-12-12
IT1010174B (it) 1977-01-10
FR2232084B1 (https=) 1976-12-17
GB1425283A (en) 1976-02-18
CA1009765A (en) 1977-05-03
US3879839A (en) 1975-04-29
ES426888A1 (es) 1976-09-01
DE2425915C3 (https=) 1978-09-21
SE7405789L (https=) 1974-12-05

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