JPS53143275A - Noise measuring apparatus - Google Patents

Noise measuring apparatus

Info

Publication number
JPS53143275A
JPS53143275A JP5797077A JP5797077A JPS53143275A JP S53143275 A JPS53143275 A JP S53143275A JP 5797077 A JP5797077 A JP 5797077A JP 5797077 A JP5797077 A JP 5797077A JP S53143275 A JPS53143275 A JP S53143275A
Authority
JP
Japan
Prior art keywords
measuring apparatus
noise measuring
noise
measure
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5797077A
Other languages
Japanese (ja)
Other versions
JPS6134101B2 (en
Inventor
Tadashi Katsura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP5797077A priority Critical patent/JPS53143275A/en
Publication of JPS53143275A publication Critical patent/JPS53143275A/en
Publication of JPS6134101B2 publication Critical patent/JPS6134101B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To measure crest values with good reproducibility and also make possible measuring of square-law mean values in a short time by amplifying and sampling the noise to be measured and obtaining the mean value and the measure of dispersion thereof with an apparatus of measuring the noise produced by a semiconductor device.
COPYRIGHT: (C)1978,JPO&Japio
JP5797077A 1977-05-18 1977-05-18 Noise measuring apparatus Granted JPS53143275A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5797077A JPS53143275A (en) 1977-05-18 1977-05-18 Noise measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5797077A JPS53143275A (en) 1977-05-18 1977-05-18 Noise measuring apparatus

Publications (2)

Publication Number Publication Date
JPS53143275A true JPS53143275A (en) 1978-12-13
JPS6134101B2 JPS6134101B2 (en) 1986-08-06

Family

ID=13070861

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5797077A Granted JPS53143275A (en) 1977-05-18 1977-05-18 Noise measuring apparatus

Country Status (1)

Country Link
JP (1) JPS53143275A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58155785U (en) * 1982-04-14 1983-10-18 株式会社東芝 plug device
JPS58201073A (en) * 1982-05-19 1983-11-22 Mitsubishi Electric Corp Noise measuring device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4697593B2 (en) * 2005-10-31 2011-06-08 住友金属工業株式会社 S / N ratio measurement method for eddy current flaw detection on the inner surface of a tube

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58155785U (en) * 1982-04-14 1983-10-18 株式会社東芝 plug device
JPS58201073A (en) * 1982-05-19 1983-11-22 Mitsubishi Electric Corp Noise measuring device
JPH0318152B2 (en) * 1982-05-19 1991-03-11 Mitsubishi Electric Corp

Also Published As

Publication number Publication date
JPS6134101B2 (en) 1986-08-06

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