JPS53139983A - Production of probe card - Google Patents

Production of probe card

Info

Publication number
JPS53139983A
JPS53139983A JP5428077A JP5428077A JPS53139983A JP S53139983 A JPS53139983 A JP S53139983A JP 5428077 A JP5428077 A JP 5428077A JP 5428077 A JP5428077 A JP 5428077A JP S53139983 A JPS53139983 A JP S53139983A
Authority
JP
Japan
Prior art keywords
production
probe card
securing
flat part
faciliate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5428077A
Other languages
Japanese (ja)
Inventor
Akihiro Tomosawa
Mitsuyoshi Oyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP5428077A priority Critical patent/JPS53139983A/en
Publication of JPS53139983A publication Critical patent/JPS53139983A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To faciliate securing of probes to cards by pressing one end being the large diameter portion of a fine taper form probe of conductive material to a flat part, bending the sharp pointed part of the other end at a right angle to this, thereafter securing the flat part to an insulation plate card which is provided with wiring patterns.
COPYRIGHT: (C)1978,JPO&Japio
JP5428077A 1977-05-13 1977-05-13 Production of probe card Pending JPS53139983A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5428077A JPS53139983A (en) 1977-05-13 1977-05-13 Production of probe card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5428077A JPS53139983A (en) 1977-05-13 1977-05-13 Production of probe card

Publications (1)

Publication Number Publication Date
JPS53139983A true JPS53139983A (en) 1978-12-06

Family

ID=12966143

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5428077A Pending JPS53139983A (en) 1977-05-13 1977-05-13 Production of probe card

Country Status (1)

Country Link
JP (1) JPS53139983A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55163854A (en) * 1979-06-06 1980-12-20 Nippon Denshi Zairyo Kk Manufacture of semiconductor wafer testing probe
JPS6053853A (en) * 1983-09-02 1985-03-27 Nec Corp Probe card
JPS6376343A (en) * 1986-09-18 1988-04-06 Nec Corp Probe card
JPS6484729A (en) * 1987-09-28 1989-03-30 Tokyo Electron Ltd Probing card
JPH0650989A (en) * 1992-07-28 1994-02-25 Nippon Maikuronikusu:Kk Manufacture of probe needle
JPH0666833A (en) * 1992-04-28 1994-03-11 Nippon Denshi Zairyo Kk Probe for probe card

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55163854A (en) * 1979-06-06 1980-12-20 Nippon Denshi Zairyo Kk Manufacture of semiconductor wafer testing probe
JPS6053853A (en) * 1983-09-02 1985-03-27 Nec Corp Probe card
JPS6376343A (en) * 1986-09-18 1988-04-06 Nec Corp Probe card
JPS6484729A (en) * 1987-09-28 1989-03-30 Tokyo Electron Ltd Probing card
JPH0666833A (en) * 1992-04-28 1994-03-11 Nippon Denshi Zairyo Kk Probe for probe card
JPH0650989A (en) * 1992-07-28 1994-02-25 Nippon Maikuronikusu:Kk Manufacture of probe needle

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