JPS53139983A - Production of probe card - Google Patents
Production of probe cardInfo
- Publication number
- JPS53139983A JPS53139983A JP5428077A JP5428077A JPS53139983A JP S53139983 A JPS53139983 A JP S53139983A JP 5428077 A JP5428077 A JP 5428077A JP 5428077 A JP5428077 A JP 5428077A JP S53139983 A JPS53139983 A JP S53139983A
- Authority
- JP
- Japan
- Prior art keywords
- production
- probe card
- securing
- flat part
- faciliate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To faciliate securing of probes to cards by pressing one end being the large diameter portion of a fine taper form probe of conductive material to a flat part, bending the sharp pointed part of the other end at a right angle to this, thereafter securing the flat part to an insulation plate card which is provided with wiring patterns.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5428077A JPS53139983A (en) | 1977-05-13 | 1977-05-13 | Production of probe card |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5428077A JPS53139983A (en) | 1977-05-13 | 1977-05-13 | Production of probe card |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS53139983A true JPS53139983A (en) | 1978-12-06 |
Family
ID=12966143
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5428077A Pending JPS53139983A (en) | 1977-05-13 | 1977-05-13 | Production of probe card |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS53139983A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55163854A (en) * | 1979-06-06 | 1980-12-20 | Nippon Denshi Zairyo Kk | Manufacture of semiconductor wafer testing probe |
JPS6053853A (en) * | 1983-09-02 | 1985-03-27 | Nec Corp | Probe card |
JPS6376343A (en) * | 1986-09-18 | 1988-04-06 | Nec Corp | Probe card |
JPS6484729A (en) * | 1987-09-28 | 1989-03-30 | Tokyo Electron Ltd | Probing card |
JPH0650989A (en) * | 1992-07-28 | 1994-02-25 | Nippon Maikuronikusu:Kk | Manufacture of probe needle |
JPH0666833A (en) * | 1992-04-28 | 1994-03-11 | Nippon Denshi Zairyo Kk | Probe for probe card |
-
1977
- 1977-05-13 JP JP5428077A patent/JPS53139983A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55163854A (en) * | 1979-06-06 | 1980-12-20 | Nippon Denshi Zairyo Kk | Manufacture of semiconductor wafer testing probe |
JPS6053853A (en) * | 1983-09-02 | 1985-03-27 | Nec Corp | Probe card |
JPS6376343A (en) * | 1986-09-18 | 1988-04-06 | Nec Corp | Probe card |
JPS6484729A (en) * | 1987-09-28 | 1989-03-30 | Tokyo Electron Ltd | Probing card |
JPH0666833A (en) * | 1992-04-28 | 1994-03-11 | Nippon Denshi Zairyo Kk | Probe for probe card |
JPH0650989A (en) * | 1992-07-28 | 1994-02-25 | Nippon Maikuronikusu:Kk | Manufacture of probe needle |
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