JPS5312334B2 - - Google Patents
Info
- Publication number
- JPS5312334B2 JPS5312334B2 JP7642572A JP7642572A JPS5312334B2 JP S5312334 B2 JPS5312334 B2 JP S5312334B2 JP 7642572 A JP7642572 A JP 7642572A JP 7642572 A JP7642572 A JP 7642572A JP S5312334 B2 JPS5312334 B2 JP S5312334B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/30—Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
- G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US16771171A | 1971-07-30 | 1971-07-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4825444A JPS4825444A (ja) | 1973-04-03 |
| JPS5312334B2 true JPS5312334B2 (ja) | 1978-04-28 |
Family
ID=22608496
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7642572A Expired JPS5312334B2 (ja) | 1971-07-30 | 1972-07-29 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US3771056A (ja) |
| JP (1) | JPS5312334B2 (ja) |
| CA (1) | CA999949A (ja) |
| DE (1) | DE2237424A1 (ja) |
| FR (1) | FR2148265A1 (ja) |
| GB (1) | GB1350165A (ja) |
| NL (1) | NL7210445A (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS634199Y2 (ja) * | 1980-01-29 | 1988-02-02 |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5136941Y2 (ja) * | 1973-02-28 | 1976-09-09 | ||
| JPS6139330Y2 (ja) * | 1977-06-30 | 1986-11-11 | ||
| US4476432A (en) * | 1982-02-10 | 1984-10-09 | Tektronix, Inc. | Waveform measurement system |
| US4772847A (en) * | 1985-04-17 | 1988-09-20 | Hitachi, Ltd. | Stroboscopic type potential measurement device |
| US4755742A (en) * | 1986-04-30 | 1988-07-05 | Tektronix, Inc. | Dual channel time domain reflectometer |
| EP0321808A1 (de) * | 1987-12-23 | 1989-06-28 | BBC Brown Boveri AG | Verfahren zum Messen eines Wellenwiderstandes und einer Ausbreitungskonstante eines Zweitors |
| JP2808740B2 (ja) * | 1989-10-31 | 1998-10-08 | 横河電機株式会社 | サンプリングヘッド |
| US5068614A (en) * | 1990-11-05 | 1991-11-26 | Tektronix, Inc. | Swept frequency domain relectometry enhancement |
| US5376888A (en) * | 1993-06-09 | 1994-12-27 | Hook; William R. | Timing markers in time domain reflectometry systems |
| US6621562B2 (en) * | 2001-09-26 | 2003-09-16 | Tempo Research Corporation | Time domain reflectometer with wideband dual balanced duplexer line coupling circuit |
| US6771023B1 (en) * | 2002-12-18 | 2004-08-03 | National Semiconductor Corporation | System and method for regulating cathode ray tube beam current using autobias |
| JP4501951B2 (ja) * | 2007-03-27 | 2010-07-14 | 日本電気株式会社 | 差動伝送回路、ディスクアレイ装置、出力信号設定方法 |
| TWI467920B (zh) * | 2011-10-31 | 2015-01-01 | Richtek Technology Corp | 高壓偏移偵測電路 |
| KR101853464B1 (ko) | 2015-06-22 | 2018-06-04 | 두산중공업 주식회사 | 실링구조를 포함하는 연료공급노즐. |
| US10955477B2 (en) * | 2018-06-29 | 2021-03-23 | Hamilton Sundstrand Corporation | Power distribution health management and monitoring |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2994825A (en) * | 1958-07-09 | 1961-08-01 | Hewlett Packard Co | Voltage to time-interval converter |
| US3248655A (en) * | 1962-05-07 | 1966-04-26 | Tektronix Inc | Ratchet memory circuit and sampling system employing such circuit |
| US3529249A (en) * | 1965-12-07 | 1970-09-15 | Texas Instruments Inc | Sample and store apparatus including means to compensate for base line drift |
| US3532980A (en) * | 1967-11-22 | 1970-10-06 | Monsanto Co | Peak voltage reader |
-
1971
- 1971-07-30 US US00167711A patent/US3771056A/en not_active Expired - Lifetime
-
1972
- 1972-07-28 CA CA148,186A patent/CA999949A/en not_active Expired
- 1972-07-28 NL NL7210445A patent/NL7210445A/xx unknown
- 1972-07-29 JP JP7642572A patent/JPS5312334B2/ja not_active Expired
- 1972-07-29 DE DE2237424A patent/DE2237424A1/de active Pending
- 1972-07-31 FR FR7228140A patent/FR2148265A1/fr not_active Withdrawn
- 1972-07-31 GB GB3566272A patent/GB1350165A/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS634199Y2 (ja) * | 1980-01-29 | 1988-02-02 |
Also Published As
| Publication number | Publication date |
|---|---|
| US3771056A (en) | 1973-11-06 |
| FR2148265A1 (ja) | 1973-03-11 |
| NL7210445A (ja) | 1973-02-01 |
| CA999949A (en) | 1976-11-16 |
| GB1350165A (en) | 1974-04-18 |
| DE2237424A1 (de) | 1973-02-01 |
| JPS4825444A (ja) | 1973-04-03 |