JPS53102379U - - Google Patents
Info
- Publication number
- JPS53102379U JPS53102379U JP600177U JP600177U JPS53102379U JP S53102379 U JPS53102379 U JP S53102379U JP 600177 U JP600177 U JP 600177U JP 600177 U JP600177 U JP 600177U JP S53102379 U JPS53102379 U JP S53102379U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP600177U JPS593581Y2 (ja) | 1977-01-20 | 1977-01-20 | プロ−ブカ−ド |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP600177U JPS593581Y2 (ja) | 1977-01-20 | 1977-01-20 | プロ−ブカ−ド |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS53102379U true JPS53102379U (ja) | 1978-08-18 |
| JPS593581Y2 JPS593581Y2 (ja) | 1984-01-31 |
Family
ID=28692749
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP600177U Expired JPS593581Y2 (ja) | 1977-01-20 | 1977-01-20 | プロ−ブカ−ド |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS593581Y2 (ja) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54173673U (ja) * | 1978-05-29 | 1979-12-07 | ||
| JPS55148436A (en) * | 1979-05-10 | 1980-11-19 | Nec Corp | Probe base plate |
| JPS60176180U (ja) * | 1984-04-28 | 1985-11-21 | 三菱電線工業株式会社 | 絶縁電線用スパ−クテスタの電極装置 |
| JPH01262476A (ja) * | 1988-04-13 | 1989-10-19 | Tokyo Electron Ltd | プローブカード及びこのプローブカードを用いた試験方法 |
-
1977
- 1977-01-20 JP JP600177U patent/JPS593581Y2/ja not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54173673U (ja) * | 1978-05-29 | 1979-12-07 | ||
| JPS55148436A (en) * | 1979-05-10 | 1980-11-19 | Nec Corp | Probe base plate |
| JPS60176180U (ja) * | 1984-04-28 | 1985-11-21 | 三菱電線工業株式会社 | 絶縁電線用スパ−クテスタの電極装置 |
| JPH01262476A (ja) * | 1988-04-13 | 1989-10-19 | Tokyo Electron Ltd | プローブカード及びこのプローブカードを用いた試験方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS593581Y2 (ja) | 1984-01-31 |