JPS5278488A - Xxray flaw detector - Google Patents

Xxray flaw detector

Info

Publication number
JPS5278488A
JPS5278488A JP50153934A JP15393475A JPS5278488A JP S5278488 A JPS5278488 A JP S5278488A JP 50153934 A JP50153934 A JP 50153934A JP 15393475 A JP15393475 A JP 15393475A JP S5278488 A JPS5278488 A JP S5278488A
Authority
JP
Japan
Prior art keywords
xxray
flaw detector
inspected
enabled
efficiency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50153934A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5424314B2 (show.php
Inventor
Yoshitetsu Tanimoto
Tetsuo Ishii
Masaji Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP50153934A priority Critical patent/JPS5278488A/ja
Publication of JPS5278488A publication Critical patent/JPS5278488A/ja
Publication of JPS5424314B2 publication Critical patent/JPS5424314B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP50153934A 1975-12-25 1975-12-25 Xxray flaw detector Granted JPS5278488A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50153934A JPS5278488A (en) 1975-12-25 1975-12-25 Xxray flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50153934A JPS5278488A (en) 1975-12-25 1975-12-25 Xxray flaw detector

Publications (2)

Publication Number Publication Date
JPS5278488A true JPS5278488A (en) 1977-07-01
JPS5424314B2 JPS5424314B2 (show.php) 1979-08-20

Family

ID=15573261

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50153934A Granted JPS5278488A (en) 1975-12-25 1975-12-25 Xxray flaw detector

Country Status (1)

Country Link
JP (1) JPS5278488A (show.php)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4968789A (show.php) * 1972-09-01 1974-07-03

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4968789A (show.php) * 1972-09-01 1974-07-03

Also Published As

Publication number Publication date
JPS5424314B2 (show.php) 1979-08-20

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