JPS5275488A - Method of obtaining standard defect signal to be utilized to set sensitivity of magnetic flaw detector* and signal generator for embodying the method - Google Patents

Method of obtaining standard defect signal to be utilized to set sensitivity of magnetic flaw detector* and signal generator for embodying the method

Info

Publication number
JPS5275488A
JPS5275488A JP15237975A JP15237975A JPS5275488A JP S5275488 A JPS5275488 A JP S5275488A JP 15237975 A JP15237975 A JP 15237975A JP 15237975 A JP15237975 A JP 15237975A JP S5275488 A JPS5275488 A JP S5275488A
Authority
JP
Japan
Prior art keywords
embodying
utilized
flaw detector
signal
magnetic flaw
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15237975A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5629782B2 (OSRAM
Inventor
Tatsuo Hiroshima
Tetsuya Hirota
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP15237975A priority Critical patent/JPS5275488A/ja
Publication of JPS5275488A publication Critical patent/JPS5275488A/ja
Publication of JPS5629782B2 publication Critical patent/JPS5629782B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP15237975A 1975-12-19 1975-12-19 Method of obtaining standard defect signal to be utilized to set sensitivity of magnetic flaw detector* and signal generator for embodying the method Granted JPS5275488A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15237975A JPS5275488A (en) 1975-12-19 1975-12-19 Method of obtaining standard defect signal to be utilized to set sensitivity of magnetic flaw detector* and signal generator for embodying the method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15237975A JPS5275488A (en) 1975-12-19 1975-12-19 Method of obtaining standard defect signal to be utilized to set sensitivity of magnetic flaw detector* and signal generator for embodying the method

Publications (2)

Publication Number Publication Date
JPS5275488A true JPS5275488A (en) 1977-06-24
JPS5629782B2 JPS5629782B2 (OSRAM) 1981-07-10

Family

ID=15539229

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15237975A Granted JPS5275488A (en) 1975-12-19 1975-12-19 Method of obtaining standard defect signal to be utilized to set sensitivity of magnetic flaw detector* and signal generator for embodying the method

Country Status (1)

Country Link
JP (1) JPS5275488A (OSRAM)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5018086A (OSRAM) * 1973-06-19 1975-02-26

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5018086A (OSRAM) * 1973-06-19 1975-02-26

Also Published As

Publication number Publication date
JPS5629782B2 (OSRAM) 1981-07-10

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