JPS5243058B2 - - Google Patents

Info

Publication number
JPS5243058B2
JPS5243058B2 JP49044524A JP4452474A JPS5243058B2 JP S5243058 B2 JPS5243058 B2 JP S5243058B2 JP 49044524 A JP49044524 A JP 49044524A JP 4452474 A JP4452474 A JP 4452474A JP S5243058 B2 JPS5243058 B2 JP S5243058B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP49044524A
Other languages
Japanese (ja)
Other versions
JPS50137672A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP49044524A priority Critical patent/JPS5243058B2/ja
Priority to US05/569,293 priority patent/US4004149A/en
Publication of JPS50137672A publication Critical patent/JPS50137672A/ja
Publication of JPS5243058B2 publication Critical patent/JPS5243058B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Details Of Television Scanning (AREA)
JP49044524A 1974-04-22 1974-04-22 Expired JPS5243058B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP49044524A JPS5243058B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1974-04-22 1974-04-22
US05/569,293 US4004149A (en) 1974-04-22 1975-04-18 Apparatus for displaying image produced by electrically charged particle beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP49044524A JPS5243058B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1974-04-22 1974-04-22

Publications (2)

Publication Number Publication Date
JPS50137672A JPS50137672A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1975-10-31
JPS5243058B2 true JPS5243058B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1977-10-28

Family

ID=12693897

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49044524A Expired JPS5243058B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1974-04-22 1974-04-22

Country Status (2)

Country Link
US (1) US4004149A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS5243058B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5618422A (en) * 1979-07-23 1981-02-21 Hitachi Ltd Measuring method for diameter of electron beam
US5546319A (en) * 1994-01-28 1996-08-13 Fujitsu Limited Method of and system for charged particle beam exposure
US10176965B1 (en) * 2017-07-05 2019-01-08 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Aberration-corrected multibeam source, charged particle beam device and method of imaging or illuminating a specimen with an array of primary charged particle beamlets

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5036397B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1969-07-11 1975-11-25
NL7100609A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1970-02-07 1971-08-10
US3711711A (en) * 1970-11-09 1973-01-16 Etec Corp Scanning electron microscope scanning system
JPS5126227B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1971-09-21 1976-08-05
JPS5221909B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1972-03-17 1977-06-14
US3842272A (en) * 1973-07-24 1974-10-15 American Optical Corp Scanning charged particle microprobe with external spurious electric field effect correction

Also Published As

Publication number Publication date
JPS50137672A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1975-10-31
US4004149A (en) 1977-01-18
USB569293I5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1976-03-30

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