JPS5235660A - Device for measuring thickness or like of dielectric material - Google Patents
Device for measuring thickness or like of dielectric materialInfo
- Publication number
- JPS5235660A JPS5235660A JP11049375A JP11049375A JPS5235660A JP S5235660 A JPS5235660 A JP S5235660A JP 11049375 A JP11049375 A JP 11049375A JP 11049375 A JP11049375 A JP 11049375A JP S5235660 A JPS5235660 A JP S5235660A
- Authority
- JP
- Japan
- Prior art keywords
- dielectric material
- measuring thickness
- thickness
- microwaves
- destractive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50110493A JPS5858602B2 (ja) | 1975-09-13 | 1975-09-13 | ユウデンタイザイリヨウノイタアツトウノケイソクソウチ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50110493A JPS5858602B2 (ja) | 1975-09-13 | 1975-09-13 | ユウデンタイザイリヨウノイタアツトウノケイソクソウチ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5235660A true JPS5235660A (en) | 1977-03-18 |
JPS5858602B2 JPS5858602B2 (ja) | 1983-12-26 |
Family
ID=14537134
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50110493A Expired JPS5858602B2 (ja) | 1975-09-13 | 1975-09-13 | ユウデンタイザイリヨウノイタアツトウノケイソクソウチ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5858602B2 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01111894A (ja) * | 1987-10-26 | 1989-04-28 | Tosoh Corp | ジペプチドエステルの精製方法 |
JPH03115806A (ja) * | 1989-09-29 | 1991-05-16 | Japan Radio Co Ltd | 積層構造における厚さ測定方法 |
JP2018021897A (ja) * | 2016-05-02 | 2018-02-08 | ロッキード マーティン コーポレイションLockheed Martin Corporation | 動的なコーティング厚さ測定及び制御 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3482160A (en) * | 1965-10-14 | 1969-12-02 | Magnaflux Corp | Microwave dielectric material testing system |
-
1975
- 1975-09-13 JP JP50110493A patent/JPS5858602B2/ja not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3482160A (en) * | 1965-10-14 | 1969-12-02 | Magnaflux Corp | Microwave dielectric material testing system |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01111894A (ja) * | 1987-10-26 | 1989-04-28 | Tosoh Corp | ジペプチドエステルの精製方法 |
JPH03115806A (ja) * | 1989-09-29 | 1991-05-16 | Japan Radio Co Ltd | 積層構造における厚さ測定方法 |
JP2018021897A (ja) * | 2016-05-02 | 2018-02-08 | ロッキード マーティン コーポレイションLockheed Martin Corporation | 動的なコーティング厚さ測定及び制御 |
Also Published As
Publication number | Publication date |
---|---|
JPS5858602B2 (ja) | 1983-12-26 |
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