JPS5217874A - Signal circuit for double-beam type photometer - Google Patents

Signal circuit for double-beam type photometer

Info

Publication number
JPS5217874A
JPS5217874A JP7689475A JP7689475A JPS5217874A JP S5217874 A JPS5217874 A JP S5217874A JP 7689475 A JP7689475 A JP 7689475A JP 7689475 A JP7689475 A JP 7689475A JP S5217874 A JPS5217874 A JP S5217874A
Authority
JP
Japan
Prior art keywords
double
signal circuit
beam type
type photometer
fixed value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7689475A
Other languages
Japanese (ja)
Inventor
Tsutomu Ogawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7689475A priority Critical patent/JPS5217874A/en
Publication of JPS5217874A publication Critical patent/JPS5217874A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

PURPOSE:Correct signal quantity below a fixed value of reference signal level by varying impressed voltage of detector, while it is corrected over a fixed value by varying gain of signal amplifier to obtain a marking circuit with good S/N in wide wavelength band.
JP7689475A 1975-06-24 1975-06-24 Signal circuit for double-beam type photometer Pending JPS5217874A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7689475A JPS5217874A (en) 1975-06-24 1975-06-24 Signal circuit for double-beam type photometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7689475A JPS5217874A (en) 1975-06-24 1975-06-24 Signal circuit for double-beam type photometer

Publications (1)

Publication Number Publication Date
JPS5217874A true JPS5217874A (en) 1977-02-10

Family

ID=13618342

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7689475A Pending JPS5217874A (en) 1975-06-24 1975-06-24 Signal circuit for double-beam type photometer

Country Status (1)

Country Link
JP (1) JPS5217874A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4914279A (en) * 1972-03-17 1974-02-07

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4914279A (en) * 1972-03-17 1974-02-07

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