JPS5213915B2 - - Google Patents
Info
- Publication number
- JPS5213915B2 JPS5213915B2 JP47014807A JP1480772A JPS5213915B2 JP S5213915 B2 JPS5213915 B2 JP S5213915B2 JP 47014807 A JP47014807 A JP 47014807A JP 1480772 A JP1480772 A JP 1480772A JP S5213915 B2 JPS5213915 B2 JP S5213915B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47014807A JPS5213915B2 (pl) | 1972-02-14 | 1972-02-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47014807A JPS5213915B2 (pl) | 1972-02-14 | 1972-02-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4897054A JPS4897054A (pl) | 1973-12-11 |
| JPS5213915B2 true JPS5213915B2 (pl) | 1977-04-18 |
Family
ID=11871299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP47014807A Expired JPS5213915B2 (pl) | 1972-02-14 | 1972-02-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5213915B2 (pl) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5856025U (ja) * | 1981-10-08 | 1983-04-15 | 川井 百合子 | 雨具 |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5399784A (en) * | 1977-02-10 | 1978-08-31 | Nec Corp | Integrated circuit device |
| US4183460A (en) * | 1977-12-23 | 1980-01-15 | Burroughs Corporation | In-situ test and diagnostic circuitry and method for CML chips |
| JPS59154679U (ja) * | 1983-03-31 | 1984-10-17 | 株式会社島津製作所 | 自己検査機能付プリント基板 |
| JP2720718B2 (ja) * | 1992-07-09 | 1998-03-04 | 株式会社デンソー | 半導体センサ装置 |
| JP2924946B2 (ja) * | 1995-09-08 | 1999-07-26 | 日本電気株式会社 | 半導体装置及びその検査方法 |
-
1972
- 1972-02-14 JP JP47014807A patent/JPS5213915B2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5856025U (ja) * | 1981-10-08 | 1983-04-15 | 川井 百合子 | 雨具 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS4897054A (pl) | 1973-12-11 |