JPS52138257U - - Google Patents
Info
- Publication number
- JPS52138257U JPS52138257U JP4695876U JP4695876U JPS52138257U JP S52138257 U JPS52138257 U JP S52138257U JP 4695876 U JP4695876 U JP 4695876U JP 4695876 U JP4695876 U JP 4695876U JP S52138257 U JPS52138257 U JP S52138257U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4695876U JPS52138257U (en:Method) | 1976-04-15 | 1976-04-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4695876U JPS52138257U (en:Method) | 1976-04-15 | 1976-04-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS52138257U true JPS52138257U (en:Method) | 1977-10-20 |
Family
ID=28506092
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4695876U Pending JPS52138257U (en:Method) | 1976-04-15 | 1976-04-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS52138257U (en:Method) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6183966A (ja) * | 1984-10-01 | 1986-04-28 | Olympus Optical Co Ltd | 電子回路基板の検査装置 |
| JPH0368082U (en:Method) * | 1989-11-02 | 1991-07-03 | ||
| JPH04184174A (ja) * | 1990-11-19 | 1992-07-01 | Graphtec Corp | 回路試験装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52122084A (en) * | 1976-04-06 | 1977-10-13 | Toshiba Corp | Inspection system for semiconductor substrates |
-
1976
- 1976-04-15 JP JP4695876U patent/JPS52138257U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52122084A (en) * | 1976-04-06 | 1977-10-13 | Toshiba Corp | Inspection system for semiconductor substrates |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6183966A (ja) * | 1984-10-01 | 1986-04-28 | Olympus Optical Co Ltd | 電子回路基板の検査装置 |
| JPH0368082U (en:Method) * | 1989-11-02 | 1991-07-03 | ||
| JPH04184174A (ja) * | 1990-11-19 | 1992-07-01 | Graphtec Corp | 回路試験装置 |