JPS52125388A - Defect inspection apparatus - Google Patents

Defect inspection apparatus

Info

Publication number
JPS52125388A
JPS52125388A JP4152076A JP4152076A JPS52125388A JP S52125388 A JPS52125388 A JP S52125388A JP 4152076 A JP4152076 A JP 4152076A JP 4152076 A JP4152076 A JP 4152076A JP S52125388 A JPS52125388 A JP S52125388A
Authority
JP
Japan
Prior art keywords
inspection apparatus
defect inspection
gate
closing
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4152076A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5728104B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Yukio Uenishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP4152076A priority Critical patent/JPS52125388A/ja
Publication of JPS52125388A publication Critical patent/JPS52125388A/ja
Publication of JPS5728104B2 publication Critical patent/JPS5728104B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP4152076A 1976-04-13 1976-04-13 Defect inspection apparatus Granted JPS52125388A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4152076A JPS52125388A (en) 1976-04-13 1976-04-13 Defect inspection apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4152076A JPS52125388A (en) 1976-04-13 1976-04-13 Defect inspection apparatus

Publications (2)

Publication Number Publication Date
JPS52125388A true JPS52125388A (en) 1977-10-21
JPS5728104B2 JPS5728104B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1982-06-15

Family

ID=12610646

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4152076A Granted JPS52125388A (en) 1976-04-13 1976-04-13 Defect inspection apparatus

Country Status (1)

Country Link
JP (1) JPS52125388A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Also Published As

Publication number Publication date
JPS5728104B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1982-06-15

Similar Documents

Publication Publication Date Title
JPS56164953A (en) Ultrasonic inspecting device for junction part
FR2425179A1 (fr) Dispositif de controle a courants de foucault
JPS57179657A (en) Inspecting device for acoustic emission
GB1121122A (en) Improvements in methods of and apparatus for measuring the ovality of an object
JPS52125388A (en) Defect inspection apparatus
JPS5355983A (en) Automatic micro defect detector
JPS52133284A (en) Probing device equipped with automatic inspection function
JPS5312218A (en) Automatic detection range setting circuit
JPS53100294A (en) Smoke detector sensitivity tester
JPS5233788A (en) Signal identification apparatus in ae signal position detection appara tus
JPS5254484A (en) Defect inspecting apparatus
ES437399A1 (es) Un aparato para mejorar la discriminacion de senales en un sistema de deteccion electronico.
JPS541684A (en) Operation checking device of defect inspecting apparatus
JPS52125389A (en) Defect inspection apparatus
JPS5271907A (en) Tone signal detector
JPS52121384A (en) Defect inspecting apparatus
JPS51116694A (en) Radar object detecting device
JPS5370473A (en) Partial discharge measuring apparatus
JPS5327459A (en) Measuring system for change-over time of trolley line
JPS5764151A (en) Ae monitor
JPS52143881A (en) Ultrasonic flaw detection output evaluating device
JPS5252688A (en) Sensitivity setting device of detector in flaw detecting machines
JPS5484783A (en) Surface inspection range setting system
JPS5522144A (en) Automatic judging device
JPS51138112A (en) Signal detecting device