JPS52115289A - Flaw detecting treating device for iron and sttel materials - Google Patents

Flaw detecting treating device for iron and sttel materials

Info

Publication number
JPS52115289A
JPS52115289A JP3274676A JP3274676A JPS52115289A JP S52115289 A JPS52115289 A JP S52115289A JP 3274676 A JP3274676 A JP 3274676A JP 3274676 A JP3274676 A JP 3274676A JP S52115289 A JPS52115289 A JP S52115289A
Authority
JP
Japan
Prior art keywords
sttel
iron
materials
treating device
flaw detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3274676A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5759937B2 (en:Method
Inventor
Masaru Fukuyama
Masakuni Toko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Nippon Steel Corp
Original Assignee
Fujitsu Ltd
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Nippon Steel Corp filed Critical Fujitsu Ltd
Priority to JP3274676A priority Critical patent/JPS52115289A/ja
Publication of JPS52115289A publication Critical patent/JPS52115289A/ja
Publication of JPS5759937B2 publication Critical patent/JPS5759937B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP3274676A 1976-03-24 1976-03-24 Flaw detecting treating device for iron and sttel materials Granted JPS52115289A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3274676A JPS52115289A (en) 1976-03-24 1976-03-24 Flaw detecting treating device for iron and sttel materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3274676A JPS52115289A (en) 1976-03-24 1976-03-24 Flaw detecting treating device for iron and sttel materials

Publications (2)

Publication Number Publication Date
JPS52115289A true JPS52115289A (en) 1977-09-27
JPS5759937B2 JPS5759937B2 (en:Method) 1982-12-17

Family

ID=12367401

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3274676A Granted JPS52115289A (en) 1976-03-24 1976-03-24 Flaw detecting treating device for iron and sttel materials

Country Status (1)

Country Link
JP (1) JPS52115289A (en:Method)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5932825A (ja) * 1982-08-18 1984-02-22 Chino Works Ltd 走査形放射温度計
JPS5932829A (ja) * 1982-08-18 1984-02-22 Chino Works Ltd 走査形放射温度計

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50153691A (en:Method) * 1974-05-31 1975-12-10

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50153691A (en:Method) * 1974-05-31 1975-12-10

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5932825A (ja) * 1982-08-18 1984-02-22 Chino Works Ltd 走査形放射温度計
JPS5932829A (ja) * 1982-08-18 1984-02-22 Chino Works Ltd 走査形放射温度計

Also Published As

Publication number Publication date
JPS5759937B2 (en:Method) 1982-12-17

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