JPS52114381A - Method of detecting fault of condenser - Google Patents
Method of detecting fault of condenserInfo
- Publication number
- JPS52114381A JPS52114381A JP3169476A JP3169476A JPS52114381A JP S52114381 A JPS52114381 A JP S52114381A JP 3169476 A JP3169476 A JP 3169476A JP 3169476 A JP3169476 A JP 3169476A JP S52114381 A JPS52114381 A JP S52114381A
- Authority
- JP
- Japan
- Prior art keywords
- condenser
- detecting fault
- fault
- detecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP51031694A JPS5846709B2 (en) | 1976-03-22 | 1976-03-22 | Capacitor failure detection method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP51031694A JPS5846709B2 (en) | 1976-03-22 | 1976-03-22 | Capacitor failure detection method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS52114381A true JPS52114381A (en) | 1977-09-26 |
JPS5846709B2 JPS5846709B2 (en) | 1983-10-18 |
Family
ID=12338174
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51031694A Expired JPS5846709B2 (en) | 1976-03-22 | 1976-03-22 | Capacitor failure detection method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5846709B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016011953A (en) * | 2014-06-04 | 2016-01-21 | 株式会社Top | Power semiconductor test apparatus |
-
1976
- 1976-03-22 JP JP51031694A patent/JPS5846709B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016011953A (en) * | 2014-06-04 | 2016-01-21 | 株式会社Top | Power semiconductor test apparatus |
Also Published As
Publication number | Publication date |
---|---|
JPS5846709B2 (en) | 1983-10-18 |
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