JPS5193169A - - Google Patents
Info
- Publication number
- JPS5193169A JPS5193169A JP50018288A JP1828875A JPS5193169A JP S5193169 A JPS5193169 A JP S5193169A JP 50018288 A JP50018288 A JP 50018288A JP 1828875 A JP1828875 A JP 1828875A JP S5193169 A JPS5193169 A JP S5193169A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50018288A JPS5818780B2 (ja) | 1975-02-12 | 1975-02-12 | 半導体ペレットの検出方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50018288A JPS5818780B2 (ja) | 1975-02-12 | 1975-02-12 | 半導体ペレットの検出方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5193169A true JPS5193169A (fr) | 1976-08-16 |
| JPS5818780B2 JPS5818780B2 (ja) | 1983-04-14 |
Family
ID=11967429
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50018288A Expired JPS5818780B2 (ja) | 1975-02-12 | 1975-02-12 | 半導体ペレットの検出方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5818780B2 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5599736A (en) * | 1979-01-25 | 1980-07-30 | Nec Corp | Marking method for semiconductor wafer |
-
1975
- 1975-02-12 JP JP50018288A patent/JPS5818780B2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5599736A (en) * | 1979-01-25 | 1980-07-30 | Nec Corp | Marking method for semiconductor wafer |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5818780B2 (ja) | 1983-04-14 |