JPS5193169A - - Google Patents

Info

Publication number
JPS5193169A
JPS5193169A JP50018288A JP1828875A JPS5193169A JP S5193169 A JPS5193169 A JP S5193169A JP 50018288 A JP50018288 A JP 50018288A JP 1828875 A JP1828875 A JP 1828875A JP S5193169 A JPS5193169 A JP S5193169A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50018288A
Other languages
Japanese (ja)
Other versions
JPS5818780B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP50018288A priority Critical patent/JPS5818780B2/ja
Publication of JPS5193169A publication Critical patent/JPS5193169A/ja
Publication of JPS5818780B2 publication Critical patent/JPS5818780B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP50018288A 1975-02-12 1975-02-12 半導体ペレットの検出方法 Expired JPS5818780B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50018288A JPS5818780B2 (ja) 1975-02-12 1975-02-12 半導体ペレットの検出方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50018288A JPS5818780B2 (ja) 1975-02-12 1975-02-12 半導体ペレットの検出方法

Publications (2)

Publication Number Publication Date
JPS5193169A true JPS5193169A (enrdf_load_html_response) 1976-08-16
JPS5818780B2 JPS5818780B2 (ja) 1983-04-14

Family

ID=11967429

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50018288A Expired JPS5818780B2 (ja) 1975-02-12 1975-02-12 半導体ペレットの検出方法

Country Status (1)

Country Link
JP (1) JPS5818780B2 (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5599736A (en) * 1979-01-25 1980-07-30 Nec Corp Marking method for semiconductor wafer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5599736A (en) * 1979-01-25 1980-07-30 Nec Corp Marking method for semiconductor wafer

Also Published As

Publication number Publication date
JPS5818780B2 (ja) 1983-04-14

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